Issued Patents All Time
Showing 25 most recent of 77 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12248003 | Clustered rigid wafer test probe | Grant Wagner, Peter W. Neff, Jacob Louis Moore, Melissa Keefe | 2025-03-11 |
| 12214370 | Double tentacle pump system for a liquid sprayer | Andrew C. Putrello | 2025-02-04 |
| 12171374 | Blender system with rotatable blade assembly | Daniel Stephen Potter | 2024-12-24 |
| 11801522 | Double tentacle pump system for a liquid sprayer | Andrew C. Putrello | 2023-10-31 |
| 11675010 | Compliant wafer probe assembly | Grant Wagner, Jacob Louis Moore, Peter W. Neff | 2023-06-13 |
| 11662366 | Wafer probe with elastomer support | Grant Wagner, Jacob Louis Moore, Peter W. Neff | 2023-05-30 |
| 11653793 | Blender system with rotatable blade assembly | Daniel Stephen Potter | 2023-05-23 |
| 11561243 | Compliant organic substrate assembly for rigid probes | Grant Wagner, Marc D. Knox, Dennis R. Conti | 2023-01-24 |
| 11322473 | Interconnect and tuning thereof | Grant Wagner, Marc D. Knox, Dennis R. Conti | 2022-05-03 |
| 11166596 | Blender system with rotatable blade assembly | Daniel Stephen Potter | 2021-11-09 |
| 11131689 | Low-force wafer test probes | S J. Chey, Doreen D. DiMilia, Sankeerth Rajalingam, Grant Wagner | 2021-09-28 |
| 11085949 | Probe card assembly | Dustin M. Fregeau, David L. Gardell, Peter W. Neff, Frederick H. Roy, III, Grant Wagner | 2021-08-10 |
| 11041879 | Fluidized alignment of a semiconductor die to a test probe | Eugene Atwood, Grant Wagner | 2021-06-22 |
| 11029334 | Low force wafer test probe | Dennis R. Conti, Marc D. Knox, Grant Wagner | 2021-06-08 |
| 11009545 | Integrated circuit tester probe contact liner | Charles L. Arvin, Dennis R. Conti, Brian M. Erwin, Grant Wagner | 2021-05-18 |
| 10955439 | Electrochemical cleaning of test probes | Charles L. Arvin, Grant Wagner | 2021-03-23 |
| 10670653 | Integrated circuit tester probe contact liner | Charles L. Arvin, Dennis R. Conti, Brian M. Erwin, Grant Wagner | 2020-06-02 |
| 10663487 | Low force wafer test probe with variable geometry | Dennis R. Conti, Marc D. Knox, Grant Wagner | 2020-05-26 |
| 10578648 | Probe card assembly | Dustin M. Fregeau, David L. Gardell, Peter W. Neff, Frederick H. Roy, III, Grant Wagner | 2020-03-03 |
| 10571490 | Solder bump array probe tip structure for laser cleaning | Dennis M. Bronson, Jr., Joseph K. V. Comeau, Dustin M. Fregeau, David L. Gardell, Frederick H. Roy, III +2 more | 2020-02-25 |
| 10514393 | Gimbal assembly test system and method | David L. Gardell, Peter W. Neff | 2019-12-24 |
| 10444260 | Low force wafer test probe | Dennis R. Conti, Marc D. Knox, Grant Wagner | 2019-10-15 |
| 10288645 | Organic probe substrate | Sukjay Chey, Steven A. Cordes, Anthony D. Fortin, David L. Gardell, John R. Maher +2 more | 2019-05-14 |
| 10261108 | Low force wafer test probe with variable geometry | Dennis R. Conti, Marc D. Knox, Grant Wagner | 2019-04-16 |
| 10227165 | Container lid release apparatus and method | — | 2019-03-12 |