DF

Dustin M. Fregeau

IBM: 13 patents #8,581 of 70,183Top 15%
Globalfoundries: 1 patents #2,221 of 4,424Top 55%
📍 South Burlington, VT: #165 of 1,136 inventorsTop 15%
🗺 Vermont: #542 of 4,968 inventorsTop 15%
Overall (All Time): #345,715 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDate
11085949 Probe card assembly David M. Audette, David L. Gardell, Peter W. Neff, Frederick H. Roy, III, Grant Wagner 2021-08-10
10578648 Probe card assembly David M. Audette, David L. Gardell, Peter W. Neff, Frederick H. Roy, III, Grant Wagner 2020-03-03
10571490 Solder bump array probe tip structure for laser cleaning David M. Audette, Dennis M. Bronson, Jr., Joseph K. V. Comeau, David L. Gardell, Frederick H. Roy, III +2 more 2020-02-25
9835653 Solder bump array probe tip structure for laser cleaning David M. Audette, Dennis M. Bronson, Jr., Joseph K. V. Comeau, David L. Gardell, Frederick H. Roy, III +2 more 2017-12-05
9797928 Probe card assembly David M. Audette, David L. Gardell, Peter W. Neff, Frederick H. Roy, III, Grant Wagner 2017-10-24
9335346 High performance compliant wafer test probe S. Jay Chey, Donna S. Zupanski-Nielsen, Aparna Prabhakar, Pavan Samudrala, Mohammed S. Shaikh 2016-05-10
9116200 Methodologies and test configurations for testing thermal interface materials David L. Gardell, Laura L. Kosbar, Keith C. Stevens, Grant Wagner 2015-08-25
9086433 Rigid probe with compliant characteristics David M. Audette, David L. Gardell, Grant Wagner 2015-07-21
9081034 Rigid probe with compliant characteristics David M. Audette, David L. Gardell, Grant Wagner 2015-07-14
9057741 Probe-on-substrate David M. Audette, Kevin Bocash, S. Jay Chey, Steven A. Cordes 2015-06-16
8933717 Probe-on-substrate David M. Audette, Kevin Bocash, S. Jay Chey, Steven A. Cordes 2015-01-13
8836356 Vertical probe assembly with air channel David M. Audette, David L. Gardell, Daniel J. Murphy, Grant Wagner 2014-09-16
8487304 High performance compliant wafer test probe S. Jay Chey, Donna S. Zupanski-Nielsen, Aparna Prabhakar, Pavan Samudrala, Mohammed S. Shaikh 2013-07-16
8471575 Methodologies and test configurations for testing thermal interface materials David L. Gardell, Laura L. Kosbar, Keith C. Stevens, Grant Wagner 2013-06-25