| 12248003 |
Clustered rigid wafer test probe |
David M. Audette, Grant Wagner, Jacob Louis Moore, Melissa Keefe |
2025-03-11 |
| 11675010 |
Compliant wafer probe assembly |
David M. Audette, Grant Wagner, Jacob Louis Moore |
2023-06-13 |
| 11662366 |
Wafer probe with elastomer support |
David M. Audette, Grant Wagner, Jacob Louis Moore |
2023-05-30 |
| 11085949 |
Probe card assembly |
David M. Audette, Dustin M. Fregeau, David L. Gardell, Frederick H. Roy, III, Grant Wagner |
2021-08-10 |
| 10732202 |
Repairable rigid test probe card assembly |
Craig M. Bocash, David L. Gardell |
2020-08-04 |
| 10578648 |
Probe card assembly |
David M. Audette, Dustin M. Fregeau, David L. Gardell, Frederick H. Roy, III, Grant Wagner |
2020-03-03 |
| 10514393 |
Gimbal assembly test system and method |
David L. Gardell, David M. Audette |
2019-12-24 |
| 10041976 |
Gimbal assembly test system and method |
David L. Gardell, David M. Audette |
2018-08-07 |
| 9797928 |
Probe card assembly |
David M. Audette, Dustin M. Fregeau, David L. Gardell, Frederick H. Roy, III, Grant Wagner |
2017-10-24 |
