| 12248003 |
Clustered rigid wafer test probe |
David M. Audette, Peter W. Neff, Jacob Louis Moore, Melissa Keefe |
2025-03-11 |
|
| 11675010 |
Compliant wafer probe assembly |
David M. Audette, Jacob Louis Moore, Peter W. Neff |
2023-06-13 |
$5,486,000 |
| 11662366 |
Wafer probe with elastomer support |
David M. Audette, Jacob Louis Moore, Peter W. Neff |
2023-05-30 |
$4,328,000 |
| 11561243 |
Compliant organic substrate assembly for rigid probes |
David M. Audette, Marc D. Knox, Dennis R. Conti |
2023-01-24 |
$6,971,000 |
| 11322473 |
Interconnect and tuning thereof |
David M. Audette, Marc D. Knox, Dennis R. Conti |
2022-05-03 |
$6,057,000 |
| 11131689 |
Low-force wafer test probes |
David M. Audette, S J. Chey, Doreen D. DiMilia, Sankeerth Rajalingam |
2021-09-28 |
$6,479,000 |
| 11085949 |
Probe card assembly |
David M. Audette, Dustin M. Fregeau, David L. Gardell, Peter W. Neff, Frederick H. Roy, III |
2021-08-10 |
$4,960,000 |
| 11041879 |
Fluidized alignment of a semiconductor die to a test probe |
Eugene Atwood, David M. Audette |
2021-06-22 |
$6,016,000 |
| 11029334 |
Low force wafer test probe |
David M. Audette, Dennis R. Conti, Marc D. Knox |
2021-06-08 |
$4,452,000 |
| 11009545 |
Integrated circuit tester probe contact liner |
Charles L. Arvin, David M. Audette, Dennis R. Conti, Brian M. Erwin |
2021-05-18 |
$4,116,000 |
| 10955439 |
Electrochemical cleaning of test probes |
Charles L. Arvin, David M. Audette |
2021-03-23 |
$2,115,000 |
| 10670653 |
Integrated circuit tester probe contact liner |
Charles L. Arvin, David M. Audette, Dennis R. Conti, Brian M. Erwin |
2020-06-02 |
$2,290,000 |
| 10663487 |
Low force wafer test probe with variable geometry |
David M. Audette, Dennis R. Conti, Marc D. Knox |
2020-05-26 |
$2,933,000 |
| 10578648 |
Probe card assembly |
David M. Audette, Dustin M. Fregeau, David L. Gardell, Peter W. Neff, Frederick H. Roy, III |
2020-03-03 |
$1,865,000 |
| 10444260 |
Low force wafer test probe |
David M. Audette, Dennis R. Conti, Marc D. Knox |
2019-10-15 |
$4,653,000 |
| 10261108 |
Low force wafer test probe with variable geometry |
David M. Audette, Dennis R. Conti, Marc D. Knox |
2019-04-16 |
$3,839,000 |
| 9797928 |
Probe card assembly |
David M. Audette, Dustin M. Fregeau, David L. Gardell, Peter W. Neff, Frederick H. Roy, III |
2017-10-24 |
$3,030,000 |
| 9116200 |
Methodologies and test configurations for testing thermal interface materials |
Dustin M. Fregeau, David L. Gardell, Laura L. Kosbar, Keith C. Stevens |
2015-08-25 |
$7,184,000 |
| 9086433 |
Rigid probe with compliant characteristics |
David M. Audette, Dustin M. Fregeau, David L. Gardell |
2015-07-21 |
$2,242,000 |
| 9081034 |
Rigid probe with compliant characteristics |
David M. Audette, Dustin M. Fregeau, David L. Gardell |
2015-07-14 |
$7,900,000 |
| 8836356 |
Vertical probe assembly with air channel |
David M. Audette, Dustin M. Fregeau, David L. Gardell, Daniel J. Murphy |
2014-09-16 |
$3,547,000 |
| 8471575 |
Methodologies and test configurations for testing thermal interface materials |
Dustin M. Fregeau, David L. Gardell, Laura L. Kosbar, Keith C. Stevens |
2013-06-25 |
$6,528,000 |