Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Low force wafer test probe with variable geometry

Low force wafer test probe with variable geometry

US Patent 10261108 · Granted Apr 16, 2019

Estimated economic value: $3,839,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Clustered rigid wafer test probe2025
Clustered rigid wafer test probe2025
Double tentacle pump system for a liquid sprayer2025
Blender system with rotatable blade assembly2024
Double tentacle pump system for a liquid sprayer2023
Compliant wafer probe assembly2023
Compliant wafer probe assembly2023
Wafer probe with elastomer support2023
Wafer probe with elastomer support2023
Blender system with rotatable blade assembly2023
Compliant organic substrate assembly for rigid probes2023
Compliant organic substrate assembly for rigid probes2023