Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9658255 | Signal monitoring of through-wafer vias using a multi-layer inductor | Mark A. DiRocco, Kirk D. Peterson, Norman W. Robson | 2017-05-23 |
| 9372208 | Signal monitoring of through-wafer vias using a multi-layer inductor | Mark A. DiRocco, Kirk D. Peterson, Norman W. Robson | 2016-06-21 |
| 9285417 | Low-voltage IC test for defect screening | Daniel J. Poindexter, James M. Crafts, Karre M. Greene, Kenneth A. Lavallee | 2016-03-15 |
| 9116200 | Methodologies and test configurations for testing thermal interface materials | Dustin M. Fregeau, David L. Gardell, Laura L. Kosbar, Grant Wagner | 2015-08-25 |
| 8471575 | Methodologies and test configurations for testing thermal interface materials | Dustin M. Fregeau, David L. Gardell, Laura L. Kosbar, Grant Wagner | 2013-06-25 |
| 6545333 | Light controlled silicon on insulator device | Mark B. Ketchen, Edward J. Nowak, Jed H. Rankin | 2003-04-08 |
| 6529018 | Method for monitoring defects in polysilicon gates in semiconductor devices responsive to illumination by incident light | — | 2003-03-04 |
| 6458634 | Reduction of induced charge in SOI devices during focused ion beam processing | — | 2002-10-01 |
| 6191599 | IC device under test temperature control fixture | — | 2001-02-20 |