| 11757467 |
Circuits for converting SFQ-based RZ and NRZ signaling to bilevel voltage NRZ signaling |
Derek L. Knee, Randall M. Burnett |
2023-09-12 |
$105,135,000 |
| 11133452 |
Trilayer Josephson junction structure with small air bridge and no interlevel dielectric for superconducting qubits |
Josephine B. Chang, Gerald W. Gibson |
2021-09-28 |
$6,479,000 |
| 10381542 |
Trilayer Josephson junction structure with small air bridge and no interlevel dielectric for superconducting qubits |
Josephine B. Chang, Gerald W. Gibson |
2019-08-13 |
$1,909,000 |
| 10199554 |
Trilayer Josephson junction structure with small air bridge and no interlevel dielectric for superconducting qubits |
Josephine B. Chang, Gerald W. Gibson |
2019-02-05 |
$9,200,000 |
| 9793913 |
Single-flux-quantum probabilistic digitizer |
John F. Bulzacchelli, Christopher B. Lirakis, Alexey Y. Lvov, Stanislav Polonsky, Mark B. Ritter |
2017-10-17 |
$4,096,000 |
| 9614532 |
Single-flux-quantum probabilistic digitizer |
John F. Bulzacchelli, Christopher B. Lirakis, Alexey Y. Lvov, Stanislav Polonsky, Mark B. Ritter |
2017-04-04 |
$2,713,000 |
| 9564573 |
Trilayer josephson junction structure with small air bridge and no interlevel dielectric for superconducting qubits |
Josephine B. Chang, Gerald W. Gibson |
2017-02-07 |
$2,910,000 |
| 9379303 |
Modular array of fixed-coupling quantum systems for quantum information processing |
Jay M. Gambetta, Chad Tyler Rigetti, Matthias Steffen |
2016-06-28 |
|
| 9194909 |
Single level of metal test structure for differential timing and variability measurements of integrated circuits |
Manjul Bhushan, Chin Kim |
2015-11-24 |
$3,572,000 |
| 9075109 |
Single level of metal test structure for differential timing and variability measurements of integrated circuits |
Manjul Bhushan, Chin Kim |
2015-07-07 |
$5,899,000 |
| 8755220 |
Hybrid superconducting-magnetic memory cell and array |
John F. Bulzacchelli, William J. Gallagher |
2014-06-17 |
$4,121,000 |
| 8723528 |
Active 2-dimensional array structure for parallel testing |
Manjul Bhushan |
2014-05-13 |
$6,724,000 |
| 8691608 |
Semiconductor devices having nanochannels confined by nanometer-spaced electrodes |
Stefan Harrer, Stanislav Polonsky, John A. Ott |
2014-04-08 |
$7,562,000 |
| 8642998 |
Array of quantum systems in a cavity for quantum computing |
Jay M. Gambetta, Chad Tyler Rigetti, Matthias Steffen |
2014-02-04 |
$4,435,000 |
| 8558326 |
Semiconductor devices having nanochannels confined by nanometer-spaced electrodes |
Stefan Harrer, Stanislav Polonsky, John A. Ott |
2013-10-15 |
$3,582,000 |
| 8547732 |
Hybrid superconducting-magnetic memory cell and array |
John F. Bulzacchelli, William J. Gallagher |
2013-10-01 |
$5,042,000 |
| 8456169 |
High speed measurement of random variation/yield in integrated circuit device testing |
Manjul Bhushan, Qingqing Liang, Edward P. Maciejewski |
2013-06-04 |
$4,195,000 |
| 8310269 |
Measurement of partially depleted silicon-on-insulator CMOS circuit leakage current under different steady state switching conditions |
Manjul Bhushan |
2012-11-13 |
$6,514,000 |
| 8248094 |
Acquisition of silicon-on-insulator switching history effects statistics |
Manjul Bhushan |
2012-08-21 |
$4,162,000 |
| 8208288 |
Hybrid superconducting-magnetic memory cell and array |
John F. Bulzacchelli, William J. Gallagher |
2012-06-26 |
$15,244,000 |
| 8188752 |
Yield improvement for Josephson junction test device formation |
Shwetank Kumar, Matthias Steffen, Christopher B. Lirakis, Richard M. Lazarus |
2012-05-29 |
|
| 8179120 |
Single level of metal test structure for differential timing and variability measurements of integrated circuits |
Manjul Bhushan, Chin Kim |
2012-05-15 |
$8,909,000 |
| 8027797 |
Methods and apparatus for determining a switching history time constant in an integrated circuit device |
Manjul Bhushan, Dale J. Pearson |
2011-09-27 |
$6,526,000 |
| 7733109 |
Test structure for resistive open detection using voltage contrast inspection and related methods |
Ishtiaq Ahsan, Kevin McStay, Oliver D. Patterson |
2010-06-08 |
$3,517,000 |
| 7595654 |
Methods and apparatus for inline variability measurement of integrated circuit components |
Manjul Bhushan, Karen Gettings, Wilfried E. Haensch, Brian L. Ji |
2009-09-29 |
$20,008,000 |
