MK

Mark B. Ketchen

IBM: 48 patents #1,826 of 70,183Top 3%
RTX (Raytheon): 1 patents #8,248 of 15,912Top 55%
NG Northrop Grumman: 1 patents #690 of 1,695Top 45%
Overall (All Time): #54,383 of 4,157,543Top 2%
50
Patents All Time

Issued Patents All Time

Showing 25 most recent of 50 patents

Patent #TitleCo-InventorsDate
11757467 Circuits for converting SFQ-based RZ and NRZ signaling to bilevel voltage NRZ signaling Derek L. Knee, Randall M. Burnett 2023-09-12
11133452 Trilayer Josephson junction structure with small air bridge and no interlevel dielectric for superconducting qubits Josephine B. Chang, Gerald W. Gibson 2021-09-28
10381542 Trilayer Josephson junction structure with small air bridge and no interlevel dielectric for superconducting qubits Josephine B. Chang, Gerald W. Gibson 2019-08-13
10199554 Trilayer Josephson junction structure with small air bridge and no interlevel dielectric for superconducting qubits Josephine B. Chang, Gerald W. Gibson 2019-02-05
9793913 Single-flux-quantum probabilistic digitizer John F. Bulzacchelli, Christopher B. Lirakis, Alexey Y. Lvov, Stanislav Polonsky, Mark B. Ritter 2017-10-17
9614532 Single-flux-quantum probabilistic digitizer John F. Bulzacchelli, Christopher B. Lirakis, Alexey Y. Lvov, Stanislav Polonsky, Mark B. Ritter 2017-04-04
9564573 Trilayer josephson junction structure with small air bridge and no interlevel dielectric for superconducting qubits Josephine B. Chang, Gerald W. Gibson 2017-02-07
9379303 Modular array of fixed-coupling quantum systems for quantum information processing Jay M. Gambetta, Chad Tyler Rigetti, Matthias Steffen 2016-06-28
9194909 Single level of metal test structure for differential timing and variability measurements of integrated circuits Manjul Bhushan, Chin Kim 2015-11-24
9075109 Single level of metal test structure for differential timing and variability measurements of integrated circuits Manjul Bhushan, Chin Kim 2015-07-07
8755220 Hybrid superconducting-magnetic memory cell and array John F. Bulzacchelli, William J. Gallagher 2014-06-17
8723528 Active 2-dimensional array structure for parallel testing Manjul Bhushan 2014-05-13
8691608 Semiconductor devices having nanochannels confined by nanometer-spaced electrodes Stefan Harrer, Stanislav Polonsky, John A. Ott 2014-04-08
8642998 Array of quantum systems in a cavity for quantum computing Jay M. Gambetta, Chad Tyler Rigetti, Matthias Steffen 2014-02-04
8558326 Semiconductor devices having nanochannels confined by nanometer-spaced electrodes Stefan Harrer, Stanislav Polonsky, John A. Ott 2013-10-15
8547732 Hybrid superconducting-magnetic memory cell and array John F. Bulzacchelli, William J. Gallagher 2013-10-01
8456169 High speed measurement of random variation/yield in integrated circuit device testing Manjul Bhushan, Qingqing Liang, Edward P. Maciejewski 2013-06-04
8310269 Measurement of partially depleted silicon-on-insulator CMOS circuit leakage current under different steady state switching conditions Manjul Bhushan 2012-11-13
8248094 Acquisition of silicon-on-insulator switching history effects statistics Manjul Bhushan 2012-08-21
8208288 Hybrid superconducting-magnetic memory cell and array John F. Bulzacchelli, William J. Gallagher 2012-06-26
8188752 Yield improvement for Josephson junction test device formation Shwetank Kumar, Matthias Steffen, Christopher B. Lirakis, Richard M. Lazarus 2012-05-29
8179120 Single level of metal test structure for differential timing and variability measurements of integrated circuits Manjul Bhushan, Chin Kim 2012-05-15
8027797 Methods and apparatus for determining a switching history time constant in an integrated circuit device Manjul Bhushan, Dale J. Pearson 2011-09-27
7733109 Test structure for resistive open detection using voltage contrast inspection and related methods Ishtiaq Ahsan, Kevin McStay, Oliver D. Patterson 2010-06-08
7595654 Methods and apparatus for inline variability measurement of integrated circuit components Manjul Bhushan, Karen Gettings, Wilfried E. Haensch, Brian L. Ji 2009-09-29