Issued Patents All Time
Showing 26–50 of 50 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7583125 | Methods and apparatus for pulse generation used in characterizing electronic fuses | Manjul Bhushan, Chandrasekharan Kothandaraman, Edward P. Maciejewski | 2009-09-01 |
| 7512509 | M1 testable addressable array for device parameter characterization | Manjul Bhushan | 2009-03-31 |
| 7504896 | Methods and apparatus for inline measurement of switching delay history effects in PD-SOI technology | Manjul Bhushan | 2009-03-17 |
| 7504875 | Methods and apparatus for characterizing electronic fuses used to personalize an integrated circuit | Manjul Bhushan, Chandrasekharan Kothandaraman, Edward P. Maciejewski | 2009-03-17 |
| 7355902 | Methods and apparatus for inline characterization of high speed operating margins of a storage element | Manjul Bhushan | 2008-04-08 |
| 7342406 | Methods and apparatus for inline variability measurement of integrated circuit components | Manjul Bhushan, Karen Gettings, Wilfried E. Haensch, Brian L. Ji | 2008-03-11 |
| 7295057 | Methods and apparatus for characterizing electronic fuses used to personalize an integrated circuit | Manjul Bhushan, Chandrasekharan Kothandaraman, Edward P. Maciejewski | 2007-11-13 |
| 7265639 | Methods and apparatus for ring oscillator based MOSFET gate capacitance measurements | Manjul Bhushan | 2007-09-04 |
| 7190233 | Methods and apparatus for measuring change in performance of ring oscillator circuit | Manjul Bhushan | 2007-03-13 |
| 7176695 | Method and apparatus for measuring transfer characteristics of a semiconductor device | Manjul Bhushan | 2007-02-13 |
| 7145347 | Method and apparatus for measuring transfer characteristics of a semiconductor device | Manjul Bhushan | 2006-12-05 |
| 7085658 | Method and apparatus for rapid inline measurement of parameter spreads and defects in integrated circuit chips | Manjul Bhushan | 2006-08-01 |
| 7069525 | Method and apparatus for determining characteristics of MOS devices | Manjul Bhushan | 2006-06-27 |
| 6960926 | Method and apparatus for characterizing a circuit with multiple inputs | Carl J. Anderson, Manjul Bhushan | 2005-11-01 |
| 6798261 | Method and apparatus for characterizing switching history impact | Manjul Bhushan, Dale J. Pearson | 2004-09-28 |
| 6605981 | Apparatus for biasing ultra-low voltage logic circuits | Andres Bryant, Peter E. Cottrell, John J. Ellis-Monaghan, Edward J. Nowak | 2003-08-12 |
| 6545333 | Light controlled silicon on insulator device | Edward J. Nowak, Jed H. Rankin, Keith C. Stevens | 2003-04-08 |
| 5786690 | High resolution three-axis scanning squid microscope having planar solenoids | John R. Kirtley | 1998-07-28 |
| 5635836 | Mechanical apparatus with rod, pivot, and translation means for positioning a sample for use with a scanning microscope | John R. Kirtley, Sarah H. Blanton | 1997-06-03 |
| 5523686 | Probes for scanning SQUID magnetometers | John R. Kirtley | 1996-06-04 |
| 5055158 | Planarization of Josephson integrated circuit | William J. Gallagher, Chao-Kun Hu, Mark A. Jaso, Alan W. Kleinsasser, Dale J. Pearson | 1991-10-08 |
| 5056111 | Integrated terahertz electromagnetic wave system | Irl N. Duling, III, Daniel R. Grischkowsky, Jean-Marc Halbout | 1991-10-08 |
| 4851767 | Detachable high-speed opto-electronic sampling probe | Jean-Marc Halbout, Paul A. Moskowitz, Michael R. Scheuermann | 1989-07-25 |
| 4588947 | Integrated miniature DC SQUID susceptometer for measuring properties of very small samples | — | 1986-05-13 |
| 4528530 | Low temperature electronic package having a superconductive interposer for interconnecting strip type circuits | — | 1985-07-09 |