Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8610451 | Post silicide testing for replacement high-k metal gate technologies | David M. Fried, Lidor Goren, Jiun-Hsin Liao | 2013-12-17 |
| 8039837 | In-line voltage contrast detection of PFET silicide encroachment | Oliver D. Patterson | 2011-10-18 |
| 7781239 | Semiconductor device defect type determination method and structure | Andrew McKnight, Katsunori Onishi, Keith H. Tabakman | 2010-08-24 |
| 7733109 | Test structure for resistive open detection using voltage contrast inspection and related methods | Mark B. Ketchen, Kevin McStay, Oliver D. Patterson | 2010-06-08 |
| 7719005 | Structure and method for monitoring and characterizing pattern density dependence on thermal absorption in a semiconductor manufacturing process | Oleg Gluschenkov | 2010-05-18 |
| 7612371 | Structure to monitor arcing in the processing steps of metal layer build on silicon-on-insulator semiconductors | Christine Mary Bunke, Stephen E. Greco | 2009-11-03 |
| 7515502 | Memory array peripheral structures and use | Louis L. Hsu, Xu Ouyang | 2009-04-07 |
| 7408421 | Determining thermal absorption using ring oscillator | Edward P. Maciejewski, Noah Zamdmer | 2008-08-05 |
| 7396694 | Structure for monitoring semiconductor polysilicon gate profile | Edward P. Maciejewski | 2008-07-08 |
| 7135346 | Structure for monitoring semiconductor polysilicon gate profile | Edward P. Maciejewski | 2006-11-14 |
| 7119545 | Capacitive monitors for detecting metal extrusion during electromigration | Ronald G. Filippi, Roy Iggulden, Edward W. Kiewra, Ping-Chuan Wang | 2006-10-10 |