Issued Patents All Time
Showing 25 most recent of 70 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12423486 | System and method for process window optimization in a virtual semiconductor device fabrication environment | William J. Egan, Anshuman Kunwar, Kenneth B. Greiner | 2025-09-23 |
| 11861289 | System and method for performing process model calibration in a virtual semiconductor device fabrication environment | William J. Egan, Kenneth B. Greiner, Anshuman Kunwar | 2024-01-02 |
| 11836429 | Determination of recipes for manufacturing semiconductor devices | Kapil Sawlani, Atashi Basu, Michal Danek, Emily Ann Alden | 2023-12-05 |
| 11630937 | System and method for predictive 3-D virtual fabrication | Kenneth B. Greiner, Stephen R. Breit, Daniel Faken | 2023-04-18 |
| 11624981 | Resist and etch modeling | Saravanapriyan Sriraman | 2023-04-11 |
| 11144701 | System and method for key parameter identification, process model calibration and variability analysis in a virtual semiconductor device fabrication environment | William J. Egan, Kenneth B. Greiner, Anshuman Kunwar | 2021-10-12 |
| 11074388 | System and method for predictive 3-D virtual fabrication | Kenneth B. Greiner, Stephen R. Breit, Daniel Faken | 2021-07-27 |
| 11048847 | System and method for performing a multi-etch process using material-specific behavioral parameters in a 3-D virtual fabrication environment | Kenneth B. Greiner, Daniel Faken, Stephen R. Breit | 2021-06-29 |
| 10977405 | Fill process optimization using feature scale modeling | Michael J. Bowes, Atashi Basu, Kapil Sawlani, Dongyao Li, Anand Chandrashekar +1 more | 2021-04-13 |
| 10885253 | System and method for determining dimensional range of repairable defects by deposition and etching in a virtual fabrication environment | Daniel N. Sobieski, Rich Wise, Yang Pan, Jiangjiang Gu | 2021-01-05 |
| 10762267 | System and method for electrical behavior modeling in a 3D virtual fabrication environment | Mattan Kamon, Kenneth B. Greiner, Vasanth Allampalli, Yiguang Yan | 2020-09-01 |
| 10242142 | Predictive 3-D virtual fabrication system and method | Kenneth B. Greiner, Stephen R. Breit, Daniel Faken | 2019-03-26 |
| 9965577 | System and method for performing directed self-assembly in a 3-D virtual fabrication environment | Mattan Kamon, Kenneth B. Greiner | 2018-05-08 |
| 9659126 | Modeling pattern dependent effects for a 3-D virtual semiconductor fabrication environment | Kenneth B. Greiner, Mattan Kamon, Daniel Faken | 2017-05-23 |
| 9317632 | System and method for modeling epitaxial growth in a 3-D virtual fabrication environment | Daniel Faken, Kenneth B. Greiner, Stephen R. Breit | 2016-04-19 |
| 9087928 | High density memory cells using lateral epitaxy | Roger A. Booth, Jr., Kangguo Cheng, Joseph Ervin, Byeong Y. Kim, Chengwen Pei +2 more | 2015-07-21 |
| 8959464 | Multi-etch process using material-specific behavioral parameters in 3-D virtual fabrication environment | Kenneth B. Greiner, Daniel Faken, Stephen R. Breit | 2015-02-17 |
| 8829585 | High density memory cells using lateral epitaxy | Roger A. Booth, Jr., Kangguo Cheng, Joseph Ervin, Byeong Y. Kim, Chengwen Pei +2 more | 2014-09-09 |
| 8832620 | Rule checks in 3-D virtual fabrication environment | Kenneth B. Greiner, Mark J. Stock, Stephen R. Breit | 2014-09-09 |
| 8809953 | FET structures with trench implantation to improve back channel leakage and body resistance | Jeffrey B. Johnson, Kevin McStay, Paul C. Parries, Chengwen Pei, Gan Wang +2 more | 2014-08-19 |
| 8610451 | Post silicide testing for replacement high-k metal gate technologies | Ishtiaq Ahsan, Lidor Goren, Jiun-Hsin Liao | 2013-12-17 |
| 8598683 | Semiconductor structure having varactor with parallel DC path adjacent thereto | Edward J. Nowak | 2013-12-03 |
| 8236632 | FET structures with trench implantation to improve back channel leakage and body resistance | Jeffrey B. Johnson, Kevin McStay, Paul C. Parries, Chengwen Pei, Gan Wang +2 more | 2012-08-07 |
| 8232624 | Semiconductor structure having varactor with parallel DC path adjacent thereto | Joseph E. Nowak | 2012-07-31 |
| 8120138 | High-Z structure and method for co-alignment of mixed optical and electron beam lithographic fabrication levels | John Michael Hergenrother, Sharee McNab, Michael J. Rooks, Anna W. Topol | 2012-02-21 |