Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12423486 | System and method for process window optimization in a virtual semiconductor device fabrication environment | William J. Egan, Kenneth B. Greiner, David M. Fried | 2025-09-23 |
| 11861289 | System and method for performing process model calibration in a virtual semiconductor device fabrication environment | William J. Egan, Kenneth B. Greiner, David M. Fried | 2024-01-02 |
| 11144701 | System and method for key parameter identification, process model calibration and variability analysis in a virtual semiconductor device fabrication environment | William J. Egan, Kenneth B. Greiner, David M. Fried | 2021-10-12 |