Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12417646 | Systems and methods for image segmentation | Neil Ira Weisenfeld, Paul Ryvkin | 2025-09-16 |
| 12406364 | Systems and methods for spatial analysis of analytes using fiducial alignment | — | 2025-09-02 |
| 12406371 | Systems and methods for image segmentation using multiple stain indicators | Neil Ira Weisenfeld, Paul Ryvkin, Xiaoyan Qian, Preyas Shah | 2025-09-02 |
| D1069162 | Specimen substrate | — | 2025-04-01 |
| 12223751 | Self-test for imaging device | William Nitsch, Neil Ira Weisenfeld, Reynaldo Farias Zorrilla, Pratomo Putra Alimsijah, Augusto Manuel Tentori +2 more | 2025-02-11 |
| 10977405 | Fill process optimization using feature scale modeling | Michael J. Bowes, Atashi Basu, Kapil Sawlani, Anand Chandrashekar, David M. Fried +1 more | 2021-04-13 |