Issued Patents All Time
Showing 25 most recent of 77 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12406980 | Aluminum oxide protected lithium metal tunable 3D silicon batteries | John Collins, Devendra K. Sadana | 2025-09-02 |
| 12347831 | Energy storage method using aluminum oxide protected lithium metal tunable 3D silicon batteries | John Collins, Stephen W. Bedell, Devendra K. Sadana | 2025-07-01 |
| 11003942 | Electron channeling pattern acquisition from small crystalline areas | Stephen W. Bedell, Kunal Mukherjee, Devendra K. Sadana, Brent A. Wacaser | 2021-05-11 |
| 10902912 | Electrochemical switching device with protective encapsulation | Jianshi Tang, John Rozen | 2021-01-26 |
| 10840433 | MRAM with high-aspect ratio bottom electrode | Pouya Hashemi, Bruce B. Doris, Nathan P. Marchack | 2020-11-17 |
| 10833311 | Method of making an anode structure containing a porous region | Joel P. de Souza, John Collins, Devendra K. Sadana, Marinus Hopstaken, Stephen W. Bedell | 2020-11-10 |
| 10755925 | Post growth heteroepitaxial layer separation for defect reduction in heteroepitaxial films | Stephen W. Bedell, Cheng-Wei Cheng, Kunal Mukherjee, Devendra K. Sadana, Brent A. Wacaser | 2020-08-25 |
| 10658513 | Formation of FinFET junction | Kevin K. Chan, Pouya Hashemi, Ali Khakifirooz, Alexander Reznicek | 2020-05-19 |
| 10460937 | Post growth heteroepitaxial layer separation for defect reduction in heteroepitaxial films | Stephen W. Bedell, Cheng-Wei Cheng, Kunal Mukherjee, Devendra K. Sadana, Brent A. Wacaser | 2019-10-29 |
| 10453683 | Post growth heteroepitaxial layer separation for defect reduction in heteroepitaxial films | Stephen W. Bedell, Cheng-Wei Cheng, Kunal Mukherjee, Devendra K. Sadana, Brent A. Wacaser | 2019-10-22 |
| 10417519 | Electron channeling pattern acquisition from small crystalline areas | Stephen W. Bedell, Kunal Mukherjee, Devendra K. Sadana, Brent A. Wacaser | 2019-09-17 |
| 10388522 | Selective epitaxy using epitaxy-prevention layers | Cheng-Wei Cheng, Jeehwan Kim, Devendra K. Sadana | 2019-08-20 |
| 10236384 | Formation of FinFET junction | Kevin K. Chan, Pouya Hashemi, Ali Khakifirooz, Alexander Reznicek | 2019-03-19 |
| 10127649 | Electron channeling pattern acquisition from small crystalline areas | Stephen W. Bedell, Kunal Mukherjee, Devendra K. Sadana, Brent A. Wacaser | 2018-11-13 |
| 10109737 | Method of forming high-germanium content silicon germanium alloy fins on insulator | Pouya Hashemi, Renee T. Mo, Alexander Reznicek | 2018-10-23 |
| 9984941 | Non-destructive, wafer scale method to evaluate defect density in heterogeneous epitaxial layers | Stephen W. Bedell | 2018-05-29 |
| 9972688 | Post growth defect reduction for heteroepitaxial materials | Devendra K. Sadana, Brent A. Wacaser | 2018-05-15 |
| 9947533 | Selective epitaxy using epitaxy-prevention layers | Cheng-Wei Cheng, Jeehwan Kim, Devendra K. Sadana | 2018-04-17 |
| 9917220 | Buffer layer for high performing and low light degraded solar cells | Augustin J. Hong, Marinus Hopstaken, Jeehwan Kim, Devendra K. Sadana | 2018-03-13 |
| 9865737 | Formation of FinFET junction | Kevin K. Chan, Pouya Hashemi, Ali Khakifirooz, Alexander Reznicek | 2018-01-09 |
| 9859091 | Automatic alignment for high throughput electron channeling contrast imaging | Stephen W. Bedell, Kunal Mukherjee, Devendra K. Sadana, Brent A. Wacaser | 2018-01-02 |
| 9859367 | Stacked strained and strain-relaxed hexagonal nanowires | Takashi Ando, Pouya Hashemi, Alexander Reznicek | 2018-01-02 |
| 9812530 | High germanium content silicon germanium fins | Karthik Balakrishnan, John Bruley, Pouya Hashemi, Ali Khakifirooz, Alexander Reznicek | 2017-11-07 |
| 9761661 | Stacked strained and strain-relaxed hexagonal nanowires | Takashi Ando, Pouya Hashemi, Alexander Reznicek | 2017-09-12 |
| 9741532 | Multi-beam electron microscope for electron channeling contrast imaging of semiconductor material | Stephen W. Bedell, Kunal Mukherjee, Devendra K. Sadana, Brent A. Wacaser | 2017-08-22 |