KM

Kunal Mukherjee

IBM: 16 patents #6,952 of 70,183Top 10%
University of California: 2 patents #4,561 of 18,278Top 25%
Overall (All Time): #247,171 of 4,157,543Top 6%
18
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12355213 Quantum dot lasers and methods for making the same John E. Bowers, Arthur C. Gossard, Daehwan Jung, Justin Norman, Jennifer Selvidge 2025-07-08
11804525 Dislocation glide suppression for misfit dislocation free heteroepitaxy John E. Bowers, Justin Norman, Jennifer Selvidge, Eamonn Hughes 2023-10-31
11482573 Multi-junction photovoltaic cells Stephen W. Bedell, Ning Li, Qinglong Li, Devendra K. Sadana, Ghavam G. Shahidi 2022-10-25
11003942 Electron channeling pattern acquisition from small crystalline areas Stephen W. Bedell, John A. Ott, Devendra K. Sadana, Brent A. Wacaser 2021-05-11
10755925 Post growth heteroepitaxial layer separation for defect reduction in heteroepitaxial films Stephen W. Bedell, Cheng-Wei Cheng, John A. Ott, Devendra K. Sadana, Brent A. Wacaser 2020-08-25
10581109 Fabrication method of all solid-state thin-film battery Joel P. de Souza, Yun Seog Lee, Devendra K. Sadana 2020-03-03
10529890 Light emitting diode having improved quantum efficiency at low injection current Ning Li, Qinglong Li, Devendra K. Sadana, Ghavam G. Shahidi 2020-01-07
10460937 Post growth heteroepitaxial layer separation for defect reduction in heteroepitaxial films Stephen W. Bedell, Cheng-Wei Cheng, John A. Ott, Devendra K. Sadana, Brent A. Wacaser 2019-10-29
10453683 Post growth heteroepitaxial layer separation for defect reduction in heteroepitaxial films Stephen W. Bedell, Cheng-Wei Cheng, John A. Ott, Devendra K. Sadana, Brent A. Wacaser 2019-10-22
10417519 Electron channeling pattern acquisition from small crystalline areas Stephen W. Bedell, John A. Ott, Devendra K. Sadana, Brent A. Wacaser 2019-09-17
10177062 Surface passivation having reduced interface defect density Joel P. de Souza, Yun Seog Lee, Devendra K. Sadana 2019-01-08
10170388 Surface passivation having reduced interface defect density Joel P. de Souza, Yun Seog Lee, Devendra K. Sadana 2019-01-01
10127649 Electron channeling pattern acquisition from small crystalline areas Stephen W. Bedell, John A. Ott, Devendra K. Sadana, Brent A. Wacaser 2018-11-13
10043941 Light emitting diode having improved quantum efficiency at low injection current Ning Li, Qinglong Li, Devendra K. Sadana, Ghavam G. Shahidi 2018-08-07
9984949 Surface passivation having reduced interface defect density Joel P. de Souza, Yun Seog Lee, Devendra K. Sadana 2018-05-29
9859091 Automatic alignment for high throughput electron channeling contrast imaging Stephen W. Bedell, John A. Ott, Devendra K. Sadana, Brent A. Wacaser 2018-01-02
9739728 Automatic defect detection and classification for high throughput electron channeling contrast imaging Stephen W. Bedell, Renee T. Mo, John A. Ott, Devendra K. Sadana, Brent A. Wacaser 2017-08-22
9741532 Multi-beam electron microscope for electron channeling contrast imaging of semiconductor material Stephen W. Bedell, John A. Ott, Devendra K. Sadana, Brent A. Wacaser 2017-08-22