AR

Alexander Reznicek

IBM: 1182 patents #3 of 70,183Top 1%
Globalfoundries: 77 patents #21 of 4,424Top 1%
ET Elpis Technologies: 9 patents #2 of 121Top 2%
GU Globalfoundries U.S.: 4 patents #206 of 665Top 35%
Samsung: 3 patents #30,683 of 75,807Top 45%
TE Tessera: 3 patents #129 of 271Top 50%
SS Stmicroelectronics Sa: 2 patents #601 of 1,676Top 40%
MT Matheson Tri-Gas: 1 patents #28 of 47Top 60%
IB International Business: 1 patents #4 of 119Top 4%
IM International Machines: 1 patents #1 of 34Top 3%
AS Adeia Semiconductor Solutions: 1 patents #22 of 57Top 40%
RE Renesas Electronics: 1 patents #2,739 of 4,529Top 65%
📍 Troy, NY: #1 of 610 inventorsTop 1%
🗺 New York: #2 of 115,490 inventorsTop 1%
Overall (All Time): #40 of 4,157,543Top 1%
1279
Patents All Time

Issued Patents All Time

Showing 1–25 of 1,279 patents

Patent #TitleCo-InventorsDate
12432968 Nanowire source/drain formation for nanosheet device Ruilong Xie, Julien Frougier, Kangguo Cheng 2025-09-30
12408369 Vertical transport field effect transistors having different threshold voltages along the channel Choonghyun Lee, Takashi Ando, Jingyun Zhang 2025-09-02
12402544 Antenna assisted ReRAM formation Youngseok Kim, Soon-Cheon Seo, Injo Ok 2025-08-26
12402342 Nanosheet device with T-shaped dual inner spacer Pouya Hashemi, Takashi Ando, Ruilong Xie 2025-08-26
12382682 Gate-all-around nanosheet-FET with variable channel geometries for performance optimization Julien Frougier, Ruilong Xie, Heng Wu, Chen Zhang 2025-08-05
12364174 Global heater for phase change memory Nanbo Gong, Takashi Ando, Bahman Hekmatshoartabari 2025-07-15
12364164 Reactive serial resistance reduction for magnetoresistive random-access memory devices Matthias Georg Gottwald, Guohan Hu, Stephen L. Brown 2025-07-15
12329045 Phase change memory programming current leakage reduction Injo Ok, Soon-Cheon Seo, Youngseok Kim, Timothy Mathew Philip 2025-06-10
12324237 Diffusion-break region in stacked-FET integrated circuit device Ruilong Xie, Daniel Schmidt, Tsung-Sheng Kang 2025-06-03
12317764 Uniform voltage drop in arrays of memory devices Injo Ok, Soon-Cheon Seo, Youngseok Kim 2025-05-27
12317537 Reduced parasitic capacitance semiconductor device containing at least one local interconnect passthrough structure Ruilong Xie, Dechao Guo, Junli Wang 2025-05-27
12310263 Phase change memory gaps Injo Ok, Soon-Cheon Seo, Oleg Gluschenkov 2025-05-20
12293469 Virtual reality design navigation using a temporal collaboration dependency map Jeremy R. Fox, Martin G. Keen, Bahman Hekmatshoartabari 2025-05-06
12268016 Buried power rail formation for vertical field effect transistors Ruilong Xie, Junli Wang, Brent A. Anderson, Chen Zhang, Heng Wu 2025-04-01
12262552 Source/drain epitaxy process in stacked FET Tsung-Sheng Kang, Daniel Schmidt, Ruilong Xie 2025-03-25
12255106 Multi-Vt nanosheet devices Jingyun Zhang, Takashi Ando, Choonghyun Lee 2025-03-18
12245530 Phase change memory with concentric ring-shaped heater Kangguo Cheng, Carl Radens, Juntao Li, Ruilong Xie, Praneet Adusumilli +1 more 2025-03-04
12236539 Contextual positioning in virtual space Martin G. Keen, Jeremy R. Fox, Bahman Hekmatshoartabari 2025-02-25
12237328 Minimizing shorting between FinFET epitaxial regions Kangguo Cheng, Balasubramanian Pranatharthiharan, Charan V. Surisetty 2025-02-25
12230676 Nanosheet device with tri-layer bottom dielectric isolation Xin Miao, Jingyun Zhang, Choonghyun Lee 2025-02-18
12225835 Resistive switching device having a protective electrode ring Takashi Ando, Ruilong Xie, Pouya Hashemi 2025-02-11
12219884 Phase change memory with conductive rings Kangguo Cheng, Carl Radens, Juntao Li, Ruilong Xie, Praneet Adusumilli +3 more 2025-02-04
12191352 Using different work-functions to reduce gate-induced drain leakage current in stacked nanosheet transistors Takashi Ando, Ruilong Xie, Pouya Hashemi 2025-01-07
12183826 Vertical field effect transistor with low-resistance bottom source-drain contact Choonghyun Lee, Soon-Cheon Seo, Injo Ok 2024-12-31
12176434 Strained semiconductor FET devices with epitaxial quality improvement Heng Wu, Ruilong Xie, Lan Yu 2024-12-24