JO

John A. Ott

IBM: 73 patents #977 of 70,183Top 2%
Globalfoundries: 2 patents #1,397 of 4,424Top 35%
Samsung: 2 patents #37,631 of 75,807Top 50%
📍 Greenwood Lake, NY: #1 of 1 inventorsTop 100%
🗺 New York: #913 of 115,490 inventorsTop 1%
Overall (All Time): #24,281 of 4,157,543Top 1%
77
Patents All Time

Issued Patents All Time

Showing 26–50 of 77 patents

Patent #TitleCo-InventorsDate
9739728 Automatic defect detection and classification for high throughput electron channeling contrast imaging Stephen W. Bedell, Renee T. Mo, Kunal Mukherjee, Devendra K. Sadana, Brent A. Wacaser 2017-08-22
9680018 Method of forming high-germanium content silicon germanium alloy fins on insulator Pouya Hashemi, Renee T. Mo, Alexander Reznicek 2017-06-13
9608160 Polarization free gallium nitride-based photonic devices on nanopatterned silicon Can Bayram, Cheng-Wei Cheng, Tayfun Gokmen, Ning Li, Devendra K. Sadana +1 more 2017-03-28
9574287 Gallium nitride material and device deposition on graphene terminated wafer and method of forming the same Can Bayram, Christos D. Dimitrakopoulos, Keith E. Fogel, Jeehwan Kim, Devendra K. Sadana 2017-02-21
9553153 Post growth defect reduction for heteroepitaxial materials Devendra K. Sadana, Brent A. Wacaser 2017-01-24
9530643 Selective epitaxy using epitaxy-prevention layers Cheng-Wei Cheng, Jeehwan Kim, Devendra K. Sadana 2016-12-27
9496263 Stacked strained and strain-relaxed hexagonal nanowires Takashi Ando, Pouya Hashemi, Alexander Reznicek 2016-11-15
9472450 Graphene cap for copper interconnect structures Griselda Bonilla, Christos D. Dimitrakopoulos, Alfred Grill, James B. Hannon, Qinghuang Lin +3 more 2016-10-18
9466672 Reduced defect densities in graded buffer layers by tensile strained interlayers Kangguo Cheng, Keith E. Fogel, Pouya Hashemi, Alexander Reznicek 2016-10-11
9406529 Formation of FinFET junction Kevin K. Chan, Pouya Hashemi, Ali Khakifirooz, Alexander Reznicek 2016-08-02
9368415 Non-destructive, wafer scale method to evaluate defect density in heterogeneous epitaxial layers Stephen W. Bedell 2016-06-14
9324843 High germanium content silicon germanium fins Karthik Balakrishnan, John Bruley, Pouya Hashemi, Ali Khakifirooz, Alexander Reznicek 2016-04-26
9306107 Buffer layer for high performing and low light degraded solar cells Augustin J. Hong, Marinus Hopstaken, Jeehwan Kim, Devendra K. Sadana 2016-04-05
9205631 Controlling the melt front of thin film applications Stephen W. Bedell 2015-12-08
9105518 Method of large-area circuit layout recognition Stephen W. Bedell, Bahman Hekmatshoar-Tabari, Ali Khakifirooz, Ghavam G. Shahidi, Davood Shahrjerdi 2015-08-11
9058990 Controlled spalling of group III nitrides containing an embedded spall releasing plane Can Bayram, Stephen W. Bedell, Keith E. Fogel, Devendra K. Sadana 2015-06-16
9000594 Use of graphene to limit copper surface oxidation, diffusion and electromigration in interconnect structures Ageeth A. Bol 2015-04-07
8895433 Method of forming a graphene cap for copper interconnect structures Griselda Bonilla, Christos D. Dimitrakopoulos, Alfred Grill, James B. Hannon, Qinghuang Lin +3 more 2014-11-25
8809164 Method of large-area circuit layout recognition Stephen W. Bedell, Bahman Hekmatshoartabari, Ali Khakifirooz, Ghavam G. Shahidi, Davood Shahrjerdi 2014-08-19
8691608 Semiconductor devices having nanochannels confined by nanometer-spaced electrodes Stefan Harrer, Stanislav Polonsky, Mark B. Ketchen 2014-04-08
8647978 Use of graphene to limit copper surface oxidation, diffusion and electromigration in interconnect structures Ageeth A. Bol 2014-02-11
8637836 High aspect ratio sample holder Mark C. Reuter 2014-01-28
8623761 Method of forming a graphene cap for copper interconnect structures Griselda Bonilla, Christos D. Dimitrakopoulos, Alfred Grill, James B. Hannon, Qinghuang Lin +3 more 2014-01-07
8610278 Use of graphene to limit copper surface oxidation, diffusion and electromigration in interconnect structures Ageeth A. Bol 2013-12-17
8592323 Method of large-area circuit layout recognition Stephen W. Bedell, Bahman Hekmatshoartabari, Ali Khakifirooz, Ghavam G. Shahidi, Davood Shahrjerdi 2013-11-26