Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9285417 | Low-voltage IC test for defect screening | Daniel J. Poindexter, James M. Crafts, Karre M. Greene, Keith C. Stevens | 2016-03-15 |
| 6557132 | Method and system for determining common failure modes for integrated circuits | David Gangl, Matthew S. Grady, David Iverson, Robert Edward Shearer | 2003-04-29 |