Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9336109 | Real-time rule engine for adaptive testing of integrated circuits | David E. Atkinson, Donald L. LaCroix, David B. Lutton, II, Bradley D. Pepper, Randolph P. Steel | 2016-05-10 |
| 9311201 | Real-time rule engine for adaptive testing of integrated circuits | David E. Atkinson, Donald L. LaCroix, David B. Lutton, II, Bradley D. Pepper, Randolph P. Steel | 2016-04-12 |
| 8689066 | Integrated circuit test optimization using adaptive test pattern sampling algorithm | Mark C. Johnson, Bradley D. Pepper, Dean G. Percy, Joseph C. Pranys | 2014-04-01 |
| 8087823 | Method for monitoring thermal control | Francois Aube, Timothy M. Curtin, Thomas P. Scanlon, Eric N. Smith | 2012-01-03 |
| 7620931 | Method of adding fabrication monitors to integrated circuit chips | James W. Adkisson, Greg Bazan, John M. Cohn, Thomas G. Sopchak, David P. Vallett | 2009-11-17 |
| 7323278 | Method of adding fabrication monitors to integrated circuit chips | James W. Adkisson, Greg Bazan, John M. Cohn, Thomas G. Sopchak, David P. Vallett | 2008-01-29 |
| 7240322 | Method of adding fabrication monitors to integrated circuit chips | James W. Adkisson, Greg Bazan, John M. Cohn, Thomas G. Sopchak, David P. Vallett | 2007-07-03 |
| 7194706 | Designing scan chains with specific parameter sensitivities to identify process defects | James W. Adkisson, Greg Bazan, John M. Cohn, Leendert M. Huisman, Mark D. Jaffe +5 more | 2007-03-20 |
| 7139944 | Method and system for determining minimum post production test time required on an integrated circuit device to achieve optimum reliability | Tange Barbour, Thomas S. Barnett, William V. Huott, Michael R. Ouellette | 2006-11-21 |
| 6998866 | Circuit and method for monitoring defects | Greg Bazan, John M. Cohn, Phillip J. Nigh, Leah Pastel, Thomas G. Sopchak | 2006-02-14 |
| 6909274 | Signal pin tester for AC defects in integrated circuits | Frank W. Angelotti, Louis Bernard Bushard, Scott A. Strissel | 2005-06-21 |
| 6789032 | Method of statistical binning for reliability selection | Tange Barbour, Thomas S. Barnett, Kathleen G. Purdy | 2004-09-07 |
| 6754864 | System and method to predetermine a bitmap of a self-tested embedded array | David Gangl, David Iverson, Gary W. Maier, Robert Edward Shearer, Donald L. Wheater | 2004-06-22 |
| 6590382 | Signal pin tester for AC defects in integrated circuits | Frank W. Angelotti, Louis Bernard Bushard, Scott A. Strissel | 2003-07-08 |
| 6557132 | Method and system for determining common failure modes for integrated circuits | David Gangl, David Iverson, Kenneth A. Lavallee, Robert Edward Shearer | 2003-04-29 |