| 9336109 |
Real-time rule engine for adaptive testing of integrated circuits |
David E. Atkinson, Donald L. LaCroix, David B. Lutton, II, Bradley D. Pepper, Randolph P. Steel |
2016-05-10 |
| 9311201 |
Real-time rule engine for adaptive testing of integrated circuits |
David E. Atkinson, Donald L. LaCroix, David B. Lutton, II, Bradley D. Pepper, Randolph P. Steel |
2016-04-12 |
| 8689066 |
Integrated circuit test optimization using adaptive test pattern sampling algorithm |
Mark C. Johnson, Bradley D. Pepper, Dean G. Percy, Joseph C. Pranys |
2014-04-01 |
| 8087823 |
Method for monitoring thermal control |
Francois Aube, Timothy M. Curtin, Thomas P. Scanlon, Eric N. Smith |
2012-01-03 |
| 7620931 |
Method of adding fabrication monitors to integrated circuit chips |
James W. Adkisson, Greg Bazan, John M. Cohn, Thomas G. Sopchak, David P. Vallett |
2009-11-17 |
| 7323278 |
Method of adding fabrication monitors to integrated circuit chips |
James W. Adkisson, Greg Bazan, John M. Cohn, Thomas G. Sopchak, David P. Vallett |
2008-01-29 |
| 7240322 |
Method of adding fabrication monitors to integrated circuit chips |
James W. Adkisson, Greg Bazan, John M. Cohn, Thomas G. Sopchak, David P. Vallett |
2007-07-03 |
| 7194706 |
Designing scan chains with specific parameter sensitivities to identify process defects |
James W. Adkisson, Greg Bazan, John M. Cohn, Leendert M. Huisman, Mark D. Jaffe +5 more |
2007-03-20 |
| 7139944 |
Method and system for determining minimum post production test time required on an integrated circuit device to achieve optimum reliability |
Tange Barbour, Thomas S. Barnett, William V. Huott, Michael R. Ouellette |
2006-11-21 |
| 6998866 |
Circuit and method for monitoring defects |
Greg Bazan, John M. Cohn, Phillip J. Nigh, Leah Pastel, Thomas G. Sopchak |
2006-02-14 |
| 6909274 |
Signal pin tester for AC defects in integrated circuits |
Frank W. Angelotti, Louis Bernard Bushard, Scott A. Strissel |
2005-06-21 |
| 6789032 |
Method of statistical binning for reliability selection |
Tange Barbour, Thomas S. Barnett, Kathleen G. Purdy |
2004-09-07 |
| 6754864 |
System and method to predetermine a bitmap of a self-tested embedded array |
David Gangl, David Iverson, Gary W. Maier, Robert Edward Shearer, Donald L. Wheater |
2004-06-22 |
| 6590382 |
Signal pin tester for AC defects in integrated circuits |
Frank W. Angelotti, Louis Bernard Bushard, Scott A. Strissel |
2003-07-08 |
| 6557132 |
Method and system for determining common failure modes for integrated circuits |
David Gangl, David Iverson, Kenneth A. Lavallee, Robert Edward Shearer |
2003-04-29 |
