{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "IBM", "item": "https://www.patentleaderboard.com/company/ibm"}, {"@type": "ListItem", "position": 3, "name": "Greg Bazan", "item": "https://www.patentleaderboard.com/inventor/fl:gr_ln:bazan-1"}]}
Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Greg Bazan — 6 Patents

IBM: 6 patents #16,491 of 70,183Top 25%
South Burlington, VT: #313 of 1,136 inventorsTop 30%
Vermont: #1,066 of 4,968 inventorsTop 25%
Overall (All Time): #779,687 of 4,157,543Top 20%
6 Patents All Time
Greg Bazan has been granted 6 US patents while listed as an inventor at IBM. The first was granted in 2006 and the most recent in November 2009. Greg Bazan ranks #779,687 of 4,157,543 US inventors in our database (top 18.8%). Patent records list Greg Bazan in South Burlington, VT, US.

Patents per Year

Patents granted per year, 2006 to 2009Bar chart with a peak of 2 patents in 2006.peak 22006: 2 patents20062007: 2 patents20072008: 1 patents20082009: 1 patents2009

Issued Patents All Time

Showing 1–6 of 6 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
7620931 Method of adding fabrication monitors to integrated circuit chips James W. Adkisson, John M. Cohn, Matthew S. Grady, Thomas G. Sopchak, David P. Vallett 2009-11-17 $17,738,000
7323278 Method of adding fabrication monitors to integrated circuit chips James W. Adkisson, John M. Cohn, Matthew S. Grady, Thomas G. Sopchak, David P. Vallett 2008-01-29 $11,919,000
7240322 Method of adding fabrication monitors to integrated circuit chips James W. Adkisson, John M. Cohn, Matthew S. Grady, Thomas G. Sopchak, David P. Vallett 2007-07-03 $6,885,000
7194706 Designing scan chains with specific parameter sensitivities to identify process defects James W. Adkisson, John M. Cohn, Matthew S. Grady, Leendert M. Huisman, Mark D. Jaffe +5 more 2007-03-20 $5,658,000
7089514 Defect diagnosis for semiconductor integrated circuits James W. Adkisson, John M. Cohn, Francis Gravel, Leendert M. Huisman, Phillip J. Nigh +4 more 2006-08-08 $2,377,000
6998866 Circuit and method for monitoring defects John M. Cohn, Matthew S. Grady, Phillip J. Nigh, Leah Pastel, Thomas G. Sopchak 2006-02-14 $5,958,000