Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7620931 | Method of adding fabrication monitors to integrated circuit chips | James W. Adkisson, John M. Cohn, Matthew S. Grady, Thomas G. Sopchak, David P. Vallett | 2009-11-17 |
| 7323278 | Method of adding fabrication monitors to integrated circuit chips | James W. Adkisson, John M. Cohn, Matthew S. Grady, Thomas G. Sopchak, David P. Vallett | 2008-01-29 |
| 7240322 | Method of adding fabrication monitors to integrated circuit chips | James W. Adkisson, John M. Cohn, Matthew S. Grady, Thomas G. Sopchak, David P. Vallett | 2007-07-03 |
| 7194706 | Designing scan chains with specific parameter sensitivities to identify process defects | James W. Adkisson, John M. Cohn, Matthew S. Grady, Leendert M. Huisman, Mark D. Jaffe +5 more | 2007-03-20 |
| 7089514 | Defect diagnosis for semiconductor integrated circuits | James W. Adkisson, John M. Cohn, Francis Gravel, Leendert M. Huisman, Phillip J. Nigh +4 more | 2006-08-08 |
| 6998866 | Circuit and method for monitoring defects | John M. Cohn, Matthew S. Grady, Phillip J. Nigh, Leah Pastel, Thomas G. Sopchak | 2006-02-14 |