Issued Patents All Time
Showing 25 most recent of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9140669 | Mapping density and temperature of a chip, in situ | Jerome L. Cann | 2015-09-22 |
| 8987843 | Mapping density and temperature of a chip, in situ | Jerome L. Cann | 2015-03-24 |
| 7671604 | Nanoscale fault isolation and measurement system | Philip V. Kaszuba, Theodore M. Levin | 2010-03-02 |
| 7620931 | Method of adding fabrication monitors to integrated circuit chips | James W. Adkisson, Greg Bazan, John M. Cohn, Matthew S. Grady, Thomas G. Sopchak | 2009-11-17 |
| 7511510 | Nanoscale fault isolation and measurement system | Philip V. Kaszuba, Theodore M. Levin | 2009-03-31 |
| 7484423 | Integrated carbon nanotube sensors | Mark C. Hakey, Mark E. Masters, Leah Pastel | 2009-02-03 |
| 7397263 | Sensor differentiated fault isolation | Kevin L. Condon, Theodore M. Levin, Leah Pastel | 2008-07-08 |
| 7323278 | Method of adding fabrication monitors to integrated circuit chips | James W. Adkisson, Greg Bazan, John M. Cohn, Matthew S. Grady, Thomas G. Sopchak | 2008-01-29 |
| 7285860 | Method and structure for defect monitoring of semiconductor devices using power bus wiring grids | John M. Cohn, Leah Pastel, Thomas G. Sopchak | 2007-10-23 |
| 7247877 | Integrated carbon nanotube sensors | Mark C. Hakey, Mark E. Masters, Leah Pastel | 2007-07-24 |
| 7239167 | Utilizing clock shield as defect monitor | John M. Cohn, Leah Pastel, Thomas G. Sopchak | 2007-07-03 |
| 7240322 | Method of adding fabrication monitors to integrated circuit chips | James W. Adkisson, Greg Bazan, John M. Cohn, Matthew S. Grady, Thomas G. Sopchak | 2007-07-03 |
| 7230335 | Inspection methods and structures for visualizing and/or detecting specific chip structures | Jerome L. Cann, Steven J. Holmes, Leendert M. Huisman, Cherie R. Kagan, Leah Pastel +2 more | 2007-06-12 |
| 7202689 | Sensor differentiated fault isolation | Kevin L. Condon, Theodore M. Levin, Leah Pastel | 2007-04-10 |
| 7194706 | Designing scan chains with specific parameter sensitivities to identify process defects | James W. Adkisson, Greg Bazan, John M. Cohn, Matthew S. Grady, Leendert M. Huisman +5 more | 2007-03-20 |
| 7116094 | Apparatus and method for transmission and remote sensing of signals from integrated circuit devices | Theodore M. Levin | 2006-10-03 |
| 7088124 | Utilizing clock shield as defect monitor | John M. Cohn, Leah Pastel, Thomas G. Sopchak | 2006-08-08 |
| 7089138 | Canary device for failure analysis | Pierre Jacques Bouchard, Mark C. Hakey, Mark E. Masters, Leah Pastel, James A. Slinkman | 2006-08-08 |
| 7078248 | Method and structure for defect monitoring of semiconductor devices using power bus wiring grids | John M. Cohn, Leah Pastel, Thomas G. Sopchak | 2006-07-18 |
| 7005874 | Utilizing clock shield as defect monitor | John M. Cohn, Leah Pastel, Thomas G. Sopchak | 2006-02-28 |
| 6650768 | Using time resolved light emission from VLSI circuit devices for navigation on complex systems | Richard J. Evans, Jeffrey A. Kash, Daniel R. Knebel, Phillip J. Nigh, Pia Naoko Sanda +1 more | 2003-11-18 |
| 6452209 | Semiconductor devices having backside probing capability | — | 2002-09-17 |
| 6307162 | Integrated circuit wiring | Mark E. Masters | 2001-10-23 |
| 6245587 | Method for making semiconductor devices having backside probing capability | — | 2001-06-12 |
| 6232143 | Micro probe ring assembly and method of fabrication | John Thomas Maddix, Anthony M. Palagonia, Paul Joseph Pikna | 2001-05-15 |