| 8536526 |
Methods of operating a nanoprober to electrically probe a device structure of an integrated circuit |
Paul Bell, David S. Patrick |
2013-09-17 |
$4,204,000 |
| 8039334 |
Shared gate for conventional planar device and horizontal CNT |
Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, David V. Horak, Charles W. Koburger, III |
2011-10-18 |
$4,054,000 |
| 7838943 |
Shared gate for conventional planar device and horizontal CNT |
Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, David V. Horak, Charles W. Koburger, III |
2010-11-23 |
$4,291,000 |
| 7674674 |
Method of forming a dual gated FinFET gain cell |
Toshiharu Furukawa, Mark C. Hakey, David V. Horak, Charles W. Koburger, III, Peter H. Mitchell |
2010-03-09 |
$6,686,000 |
| 7566613 |
Method of forming a dual gated FinFET gain cell |
Toshiharu Furukawa, Mark C. Hakey, David V. Horak, Charles W. Koburger, III, Peter H. Mitchell |
2009-07-28 |
$11,761,000 |
| 7535016 |
Vertical carbon nanotube transistor integration |
Toshiharu Furukawa, Mark C. Hakey, David V. Horak, Charles W. Koburger, III, Peter H. Mitchell |
2009-05-19 |
$10,497,000 |
| 7503021 |
Integrated circuit diagnosing method, system, and program product |
Matt Boucher, John M. Cohn, Richard Dauphin, Judith H. McCullen, Sarah C. Braasch +1 more |
2009-03-10 |
$6,331,000 |
| 7484423 |
Integrated carbon nanotube sensors |
Mark C. Hakey, Leah Pastel, David P. Vallett |
2009-02-03 |
$3,057,000 |
| 7473633 |
Method for making integrated circuit chip having carbon nanotube composite interconnection vias |
Toshiharu Furukawa, Mark C. Hakey, David V. Horak, Charles W. Koburger, III, Peter H. Mitchell +1 more |
2009-01-06 |
$2,860,000 |
| 7247877 |
Integrated carbon nanotube sensors |
Mark C. Hakey, Leah Pastel, David P. Vallett |
2007-07-24 |
$9,916,000 |
| 7135773 |
Integrated circuit chip utilizing carbon nanotube composite interconnection vias |
Toshiharu Furukawa, Mark C. Hakey, David V. Horak, Charles W. Koburger, III, Peter H. Mitchell +1 more |
2006-11-14 |
$5,090,000 |
| 7109546 |
Horizontal memory gain cells |
Toshiharu Furukawa, Mark C. Hakey, David V. Horak, Charles W. Koburger, III, Peter H. Mitchell |
2006-09-19 |
$6,659,000 |
| 7089138 |
Canary device for failure analysis |
Pierre Jacques Bouchard, Mark C. Hakey, Leah Pastel, James A. Slinkman, David P. Vallett |
2006-08-08 |
$2,377,000 |
| 6970372 |
Dual gated finfet gain cell |
Toshiharu Furukawa, Mark C. Hakey, David V. Horak, Charles W. Koburger, III, Peter H. Mitchell |
2005-11-29 |
$7,002,000 |
| 6627926 |
Method of designing and structure for visual and electrical test of semiconductor devices |
Thomas J. Hartswick |
2003-09-30 |
$10,221,000 |
| 6307162 |
Integrated circuit wiring |
David P. Vallett |
2001-10-23 |
$31,841,000 |
| 6251773 |
Method of designing and structure for visual and electrical test of semiconductor devices |
Thomas J. Hartswick |
2001-06-26 |
$22,108,000 |
