Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8536526 | Methods of operating a nanoprober to electrically probe a device structure of an integrated circuit | Paul Bell, David S. Patrick | 2013-09-17 |
| 8039334 | Shared gate for conventional planar device and horizontal CNT | Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, David V. Horak, Charles W. Koburger, III | 2011-10-18 |
| 7838943 | Shared gate for conventional planar device and horizontal CNT | Toshiharu Furukawa, Mark C. Hakey, Steven J. Holmes, David V. Horak, Charles W. Koburger, III | 2010-11-23 |
| 7674674 | Method of forming a dual gated FinFET gain cell | Toshiharu Furukawa, Mark C. Hakey, David V. Horak, Charles W. Koburger, III, Peter H. Mitchell | 2010-03-09 |
| 7566613 | Method of forming a dual gated FinFET gain cell | Toshiharu Furukawa, Mark C. Hakey, David V. Horak, Charles W. Koburger, III, Peter H. Mitchell | 2009-07-28 |
| 7535016 | Vertical carbon nanotube transistor integration | Toshiharu Furukawa, Mark C. Hakey, David V. Horak, Charles W. Koburger, III, Peter H. Mitchell | 2009-05-19 |
| 7503021 | Integrated circuit diagnosing method, system, and program product | Matt Boucher, John M. Cohn, Richard Dauphin, Judith H. McCullen, Sarah C. Braasch +1 more | 2009-03-10 |
| 7484423 | Integrated carbon nanotube sensors | Mark C. Hakey, Leah Pastel, David P. Vallett | 2009-02-03 |
| 7473633 | Method for making integrated circuit chip having carbon nanotube composite interconnection vias | Toshiharu Furukawa, Mark C. Hakey, David V. Horak, Charles W. Koburger, III, Peter H. Mitchell +1 more | 2009-01-06 |
| 7247877 | Integrated carbon nanotube sensors | Mark C. Hakey, Leah Pastel, David P. Vallett | 2007-07-24 |
| 7135773 | Integrated circuit chip utilizing carbon nanotube composite interconnection vias | Toshiharu Furukawa, Mark C. Hakey, David V. Horak, Charles W. Koburger, III, Peter H. Mitchell +1 more | 2006-11-14 |
| 7109546 | Horizontal memory gain cells | Toshiharu Furukawa, Mark C. Hakey, David V. Horak, Charles W. Koburger, III, Peter H. Mitchell | 2006-09-19 |
| 7089138 | Canary device for failure analysis | Pierre Jacques Bouchard, Mark C. Hakey, Leah Pastel, James A. Slinkman, David P. Vallett | 2006-08-08 |
| 6970372 | Dual gated finfet gain cell | Toshiharu Furukawa, Mark C. Hakey, David V. Horak, Charles W. Koburger, III, Peter H. Mitchell | 2005-11-29 |
| 6627926 | Method of designing and structure for visual and electrical test of semiconductor devices | Thomas J. Hartswick | 2003-09-30 |
| 6307162 | Integrated circuit wiring | David P. Vallett | 2001-10-23 |
| 6251773 | Method of designing and structure for visual and electrical test of semiconductor devices | Thomas J. Hartswick | 2001-06-26 |