Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10580615 | System and method for performing failure analysis using virtual three-dimensional imaging | Kok Hin Teo, Jay Mody, Jeffrey B. Riendeau, Jian Qiu | 2020-03-03 |
| 7944550 | System and method for detecting local mechanical stress in integreated devices | Lloyd A. Bumm, Daminda Dahayanaka, Leon Moszkowicz, James A. Slinkman | 2011-05-17 |
| 7812347 | Integrated circuit and methods of measurement and preparation of measurement structure | George W. Banke, Jr., Andrew Deering, Leon Moszkowicz, James M. Robert, James A. Slinkman | 2010-10-12 |
| 7671604 | Nanoscale fault isolation and measurement system | Theodore M. Levin, David P. Vallett | 2010-03-02 |
| 7511510 | Nanoscale fault isolation and measurement system | Theodore M. Levin, David P. Vallett | 2009-03-31 |
| 7507591 | Methods of measurement and preparation of measurement structure of integrated circuit | George W. Banke, Jr., Andrew Deering, Leon Moszkowicz, James M. Robert, James A. Slinkman | 2009-03-24 |
| 7205237 | Apparatus and method for selected site backside unlayering of si, GaAs, GaxAlyAszof SOI technologies for scanning probe microscopy and atomic force probing characterization | Andrew Deering, Terence L. Kane, Leon Moszkowicz, Carmelo F. Scrudato, Michael P. Tenney | 2007-04-17 |
| 6198300 | Silicided silicon microtips for scanning probe microscopy | Lambert A. Doezema, Leon Moszkowicz, James M. Never, James A. Slinkman | 2001-03-06 |
| 6139759 | Method of manufacturing silicided silicon microtips for scanning probe microscopy | Lambert A. Doezema, Leon Moszkowicz, James M. Never, James A. Slinkman | 2000-10-31 |