Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9624710 | Door operating system | Dustin Bowman, Kevin Landgraff, Christopher D. Adams | 2017-04-18 |
| 9170273 | High frequency capacitance-voltage nanoprobing characterization | Terence L. Kane, Matthew F. Stanton | 2015-10-27 |
| 9052338 | Inert gas delivery system for electrical inspection apparatus | Terence L. Kane, Richard W. Oldrey | 2015-06-09 |
| 8701511 | Inert gas delivery system for electrical inspection apparatus | Richard W. Oldrey, Terence L. Kane | 2014-04-22 |
| 8367483 | Antifuse structure for in line circuit modification | Terence L. Kane, Yun-Yu Wang, Keith Kwong Hon Wong | 2013-02-05 |
| 8367484 | Antifuse structure for in line circuit modification | Terence L. Kane, Yun-Yu Wang, Keith Kwong Hon Wong | 2013-02-05 |
| 8368069 | Antifuse structure for in line circuit modification | Terence L. Kane, Yun-Yu Wang, Keith Kwong Hon Wong | 2013-02-05 |
| 8368070 | Antifuse structure for in line circuit modification | Terence L. Kane, Yun-Yu Wang, Keith Kwong Hon Wong | 2013-02-05 |
| 8125048 | Antifuse structure for in line circuit modification | Terence L. Kane, Yun-Yu Wang, Keith Kwong Hon Wong | 2012-02-28 |
| 7993504 | Backside unlayering of MOSFET devices for electrical and physical characterization | Terence L. Kane, Darrell L. Miles, John D. Sylvestri | 2011-08-09 |
| 7881093 | Programmable precision resistor and method of programming the same | Anthony G. Domenicucci, Terence L. Kane, Yun-Yu Wang | 2011-02-01 |
| 7371689 | Backside unlayering of MOSFET devices for electrical and physical characterization | Terence L. Kane, Darrell L. Miles, John D. Sylvestri | 2008-05-13 |
| 7205237 | Apparatus and method for selected site backside unlayering of si, GaAs, GaxAlyAszof SOI technologies for scanning probe microscopy and atomic force probing characterization | Andrew Deering, Terence L. Kane, Philip V. Kaszuba, Leon Moszkowicz, Carmelo F. Scrudato | 2007-04-17 |
| 7015146 | Method of processing backside unlayering of MOSFET devices for electrical and physical characterization including a collimated ion plasma | Terence L. Kane, Darrell L. Miles, John D. Sylyestri | 2006-03-21 |
| 6888224 | Methods and systems for fabricating electrical connections to semiconductor structures incorporating low-k dielectric materials | Terence L. Kane | 2005-05-03 |
| 6884641 | Site-specific methodology for localization and analyzing junction defects in mosfet devices | John Bruley, Terence L. Kane, Yun-Yu Wang | 2005-04-26 |
| 6858530 | Method for electrically characterizing charge sensitive semiconductor devices | Terence L. Kane, Lawrence Fischer, Steven B. Herschbein, Ying Hong | 2005-02-22 |
| 6703641 | Structure for detecting charging effects in device processing | Terence L. Kane, Yun-Yu Wang, Malcolm P. Cambra, Jr. | 2004-03-09 |
| 6670717 | Structure and method for charge sensitive electrical devices | Terence L. Kane, Lawrence Fischer, Steven B. Herschbein, Ying Hong | 2003-12-30 |
| 6630395 | Methods for fabricating electrical connections to semiconductor structures incorporating low-k dielectric materials | Terence L. Kane | 2003-10-07 |