Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11940271 | High power device fault localization via die surface contouring | David J. Lewison, Jay A. Bunt, Frank L. Pompeo, Richard W. Oldrey, Phong T. Tran | 2024-03-26 |
| 7993504 | Backside unlayering of MOSFET devices for electrical and physical characterization | Terence L. Kane, Darrell L. Miles, Michael P. Tenney | 2011-08-09 |
| 7961307 | Angular spectrum tailoring in solid immersion microscopy for circuit analysis | Stephen Bradley Ippolito, Darrell L. Miles, Peilin Song | 2011-06-14 |
| 7826045 | Angular spectrum tailoring in solid immersion microscopy for circuit analysis | Stephen Bradley Ippolito, Darrell L. Miles, Peilin Song | 2010-11-02 |
| 7397073 | Barrier dielectric stack for seam protection | Brett H. Engel, Stephen M. Lucarini, Yun-Yu Wang | 2008-07-08 |
| 7371689 | Backside unlayering of MOSFET devices for electrical and physical characterization | Terence L. Kane, Darrell L. Miles, Michael P. Tenney | 2008-05-13 |
| 7112983 | Apparatus and method for single die backside probing of semiconductor devices | Patrick J. McGinnis, Darrell L. Miles, Richard W. Oldrey, Manuel J. Villalobos | 2006-09-26 |
| 7038474 | Laser-induced critical parameter analysis of CMOS devices | Patrick J. McGinnis | 2006-05-02 |
| 6894522 | Specific site backside underlaying and micromasking method for electrical characterization of semiconductor devices | Barbara A. Averill, Terence L. Kane, Darrell L. Miles, Richard W. Oldrey | 2005-05-17 |