| 12393543 |
System and method for utilizing a data storage device with power performance profiles and/or temperature monitoring |
Anthony Hubert Welsh, San A. Phong, Charles A. Neumann |
2025-08-19 |
| 11940271 |
High power device fault localization via die surface contouring |
David J. Lewison, Jay A. Bunt, Frank L. Pompeo, Richard W. Oldrey, John D. Sylvestri |
2024-03-26 |
| 10768230 |
Built-in device testing of integrated circuits |
Robert M. Casatuta, Mary P. Kusko, Gary W. Maier, Franco Motika |
2020-09-08 |
| 10254336 |
Iterative N-detect based logic diagnostic technique |
Mary P. Kusko, Gary W. Maier, Franco Motika |
2019-04-09 |
| 10169510 |
Dynamic fault model generation for diagnostics simulation and pattern generation |
Mary P. Kusko, Gary W. Maier, Franco Motika |
2019-01-01 |
| 10024910 |
Iterative N-detect based logic diagnostic technique |
Mary P. Kusko, Gary W. Maier, Franco Motika |
2018-07-17 |
| 9852245 |
Dynamic fault model generation for diagnostics simulation and pattern generation |
Mary P. Kusko, Gary W. Maier, Franco Motika |
2017-12-26 |
| 9552449 |
Dynamic fault model generation for diagnostics simulation and pattern generation |
Mary P. Kusko, Gary W. Maier, Franco Motika |
2017-01-24 |
| 8086924 |
Implementing diagnosis of transitional scan chain defects using logic built in self test LBIST test patterns |
Donato O. Forlenza, Orazio P. Forlenza |
2011-12-27 |
| 8065575 |
Implementing isolation of VLSI scan chain using ABIST test patterns |
Donato O. Forlenza, Orazio P. Forlenza |
2011-11-22 |
| 7934134 |
Method and apparatus for performing logic built-in self-testing of an integrated circuit |
Donato O. Forlenza, Orazio P. Forlenza, Bryan J. Robbins |
2011-04-26 |
| 7930601 |
AC ABIST diagnostic method, apparatus and program product |
Joseph Eckelman, Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley, Thomas J. Knips +1 more |
2011-04-19 |
| 7921346 |
Verification of array built-in self-test (ABIST) design-for-test/design-for-diagnostics (DFT/DFD) |
Donato O. Forlenza, Orazio P. Forlenza, Bryan J. Robbins |
2011-04-05 |
| 7908532 |
Automated system and processing for expedient diagnosis of broken shift registers latch chains |
Joseph Eckelman, Donato O. Forlenza, Orazio P. Forlenza, Robert B. Gass |
2011-03-15 |
| 7908534 |
Diagnosable general purpose test registers scan chain design |
Franco Motika, Michael R. Ouellette |
2011-03-15 |
| 7831863 |
Method for enhancing the diagnostic accuracy of a VLSI chip |
Mary P. Kusko, Gary W. Maier, Franco Motika |
2010-11-09 |
| 7475308 |
implementing deterministic based broken scan chain diagnostics |
Adrian C. Anderson, Todd Burdine, Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley |
2009-01-06 |
| 7395470 |
Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain |
Todd Burdine, Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley |
2008-07-01 |
| 7395469 |
Method for implementing deterministic based broken scan chain diagnostics |
Adrian C. Anderson, Todd Burdine, Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley |
2008-07-01 |
| 7392449 |
Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain |
Todd Burdine, Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley |
2008-06-24 |
| 6961886 |
Diagnostic method for structural scan chain designs |
Franco Motika, Phillip J. Nigh |
2005-11-01 |
