TB

Todd Burdine

IBM: 9 patents #11,918 of 70,183Top 20%
Overall (All Time): #582,563 of 4,157,543Top 15%
9
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7475308 implementing deterministic based broken scan chain diagnostics Adrian C. Anderson, Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley, Phong T. Tran 2009-01-06
7395470 Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley, Phong T. Tran 2008-07-01
7395469 Method for implementing deterministic based broken scan chain diagnostics Adrian C. Anderson, Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley, Phong T. Tran 2008-07-01
7392449 Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley, Phong T. Tran 2008-06-24
7340496 System and method for determining the Nth state of linear feedback shift registers Edward E. Kelley, Franco Motika 2008-03-04
7234090 Method and apparatus for selective scan chain diagnostics Charles J. Blasi, Orazio P. Forlenza 2007-06-19
7225374 ABIST-assisted detection of scan chain defects Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley, Steven Michnowski, James Webb 2007-05-29
7107502 Diagnostic method for detection of multiple defects in a Level Sensitive Scan Design (LSSD) 2006-09-12
7089474 Method and system for providing interactive testing of integrated circuits Franco Motika, Peilin Song 2006-08-08