Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7475308 | implementing deterministic based broken scan chain diagnostics | Adrian C. Anderson, Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley, Phong T. Tran | 2009-01-06 |
| 7395470 | Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain | Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley, Phong T. Tran | 2008-07-01 |
| 7395469 | Method for implementing deterministic based broken scan chain diagnostics | Adrian C. Anderson, Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley, Phong T. Tran | 2008-07-01 |
| 7392449 | Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain | Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley, Phong T. Tran | 2008-06-24 |
| 7340496 | System and method for determining the Nth state of linear feedback shift registers | Edward E. Kelley, Franco Motika | 2008-03-04 |
| 7234090 | Method and apparatus for selective scan chain diagnostics | Charles J. Blasi, Orazio P. Forlenza | 2007-06-19 |
| 7225374 | ABIST-assisted detection of scan chain defects | Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley, Steven Michnowski, James Webb | 2007-05-29 |
| 7107502 | Diagnostic method for detection of multiple defects in a Level Sensitive Scan Design (LSSD) | — | 2006-09-12 |
| 7089474 | Method and system for providing interactive testing of integrated circuits | Franco Motika, Peilin Song | 2006-08-08 |