Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7225374 | ABIST-assisted detection of scan chain defects | Todd Burdine, Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley, James Webb | 2007-05-29 |
| 6751765 | Method and system for determining repeatable yield detractors of integrated circuits | Richard F. Rizzolo, Rocco E. DeStefano, Joseph Eckelman, Thomas G. Foote, Franco Motika +2 more | 2004-06-15 |