Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6751765 | Method and system for determining repeatable yield detractors of integrated circuits | Richard F. Rizzolo, Joseph Eckelman, Thomas G. Foote, Steven Michnowski, Franco Motika +2 more | 2004-06-15 |