Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11501047 | Error injection for timing margin protection and frequency closure | Sean Michael Carey, Bodo Hoppe, Divya K. Joshi, Paul Jacob Logsdon, Sreekala Anandavally +1 more | 2022-11-15 |
| 11105853 | Empirical LBIST latch switching and state probability determination | Franco Motika, Paul Jacob Logsdon | 2021-08-31 |
| 10048734 | Adaptive power capping in a chip | Charles R. Lefurgy, Preetham M. Lobo, Malcolm S. Allen-Ware, Tobias Webel | 2018-08-14 |
| 9874917 | Adaptive power capping in a chip | Charles R. Lefurgy, Preetham M. Lobo, Malcolm S. Allen-Ware, Tobias Webel | 2018-01-23 |
| 9733685 | Temperature-aware microprocessor voltage management | Charles R. Lefurgy, Karthick Rajamani, Malcolm S. Allen-Ware | 2017-08-15 |
| 9575529 | Voltage droop reduction in a processor | Brian W. Curran, Preetham M. Lobo, James D. Warnock, Tobias Webel | 2017-02-21 |
| 7650535 | Array delete mechanisms for shipping a microprocessor with defective arrays | Norbert Hagspiel, William V. Huott, Frank Lehnert, Brian R. Prasky, Rolf Sautter | 2010-01-19 |
| 6971054 | Method and system for determining repeatable yield detractors of integrated circuits | Raymond J. Kurtulik, Franco Motika | 2005-11-29 |
| 6751765 | Method and system for determining repeatable yield detractors of integrated circuits | Rocco E. DeStefano, Joseph Eckelman, Thomas G. Foote, Steven Michnowski, Franco Motika +2 more | 2004-06-15 |
| 6728914 | Random path delay testing methodology | Kevin William McCauley, William V. Huott, Mary P. Kusko, Peilin Song, Ulrich Baur +1 more | 2004-04-27 |
| 6662324 | Global transition scan based AC method | Franco Motika, Peilin Song, William V. Huott, Ulrich Baur | 2003-12-09 |
| 6532571 | Method to improve a testability analysis of a hierarchical design | Richard M. Gabrielson, Kevin William McCauley, Bryan J. Robbins, Joseph M. Swenton | 2003-03-11 |
| 6490702 | Scan structure for improving transition fault coverage and scan diagnostics | Peilin Song, Franco Motika, Ulrich Baur | 2002-12-03 |
| 6453436 | Method and apparatus for improving transition fault testability of semiconductor chips | Peilin Song | 2002-09-17 |
| 6442720 | Technique to decrease the exposure time of infrared imaging of semiconductor chips for failure analysis | Timothy J. Koprowski, Mary P. Kusko, Peilin Song | 2002-08-27 |
| 5455931 | Programmable clock tuning system and method | Peter J. Camporese, Patrick J. Meaney, Brian J. O'Leary | 1995-10-03 |
| 5142167 | Encoding for simultaneous switching output noise reduction | Joseph L. Temple, III, Charles B. Winn | 1992-08-25 |
| 4760289 | Two-level differential cascode current switch masterslice | Edward B. Eichelberger, Stephen E. Bello, Rolf O. Bergenn, William Chu, John A. Ludwig | 1988-07-26 |