Issued Patents All Time
Showing 25 most recent of 86 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11901002 | RRAM filament spatial localization using a laser stimulation | Franco Stellari, Ernest Y. Wu, Takashi Ando | 2024-02-13 |
| 11879932 | Detection of an aged circuit | Franco Stellari, Naigang Wang | 2024-01-23 |
| 11748524 | Tamper resistant obfuscation circuit | Jean-Olivier Plouchart, Dirk Pfeiffer, Arvind Kumar, Takashi Ando | 2023-09-05 |
| 11715195 | Machine learning-based circuit board inspection | Franco Stellari, Cyril Cabral, Jr., Steven G. Shevach | 2023-08-01 |
| 11587890 | Tamper-resistant circuit, back-end of the line memory and physical unclonable function for supply chain protection | Jean-Olivier Plouchart, Dirk Pfeiffer, Arvind Kumar, Takashi Ando | 2023-02-21 |
| 11538147 | Using photonic emission to develop electromagnetic emission models | Andrea Bahgat Shehata, Franco Stellari | 2022-12-27 |
| 11508438 | RRAM filament location based on NIR emission | Franco Stellari, Takashi Ando, Cyril Cabral, Jr., Eduard A. Cartier, Martin M. Frank +1 more | 2022-11-22 |
| 11480612 | Scanning methods for creating time-resolved emission images of integrated circuits using a single-point single-photon detector and a scanning system | Franco Stellari | 2022-10-25 |
| 11307250 | Creating time-resolved emission images of integrated circuits using a single-point single-photon detector and a scanning system | Franco Stellari | 2022-04-19 |
| 11287630 | Imaging integrated circuits using a single-point single-photon detector and a scanning system and calculating of a per-pixel value | Franco Stellari | 2022-03-29 |
| 11169200 | Method for the characterization and monitoring of integrated circuits | Raphael P. Robertazzi, Franco Stellari | 2021-11-09 |
| 11105856 | Detection of performance degradation in integrated circuits | Emily A. Ray, Emmanuel Yashchin, Kevin G. Stawiasz, Barry P. Linder, Alan J. Weger +4 more | 2021-08-31 |
| 11106764 | Integrated circuit identification | Andrea Bahgat Shehata, Franco Stellari | 2021-08-31 |
| 11061063 | Method for the characterization and monitoring of integrated circuits | Raphael P. Robertazzi, Franco Stellari | 2021-07-13 |
| 11036832 | Integrated circuit identification | Andrea Bahgat Shehata, Franco Stellari | 2021-06-15 |
| 10928448 | Automated scan chain diagnostics using emission | Franco Stellari | 2021-02-23 |
| 10895596 | Method and system for quickly identifying circuit components in an emission image | Franco Stellari | 2021-01-19 |
| 10755397 | Automated focusing of a microscope of an optical inspection system | Franco Stellari, Chung-Ching Lin | 2020-08-25 |
| 10755404 | Integrated circuit defect detection using pattern images | Chung-Ching Lin, Thomas M. Shaw, Franco Stellari, Thomas A. Wassick | 2020-08-25 |
| 10591539 | Automated scan chain diagnostics using emission | Franco Stellari | 2020-03-17 |
| 10574240 | Ring oscillator structures to determine local voltage value | Keith A. Jenkins, James H. Stathis, Franco Stellari | 2020-02-25 |
| 10571520 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Franco Stellari, Alan J. Weger | 2020-02-25 |
| 10552278 | Non-destructive analysis to determine use history of processor | Keith A. Jenkins, Barry P. Linder, Emily A. Ray, Raphael P. Robertazzi, James H. Stathis +4 more | 2020-02-04 |
| 10521897 | Using photonic emission to develop electromagnetic emission models | Andrea Bahgat Shehata, Franco Stallari | 2019-12-31 |
| 10515181 | Integrated circuit identification | Andrea Bahgat Shehata, Franco Stellari | 2019-12-24 |