Issued Patents All Time
Showing 25 most recent of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11105856 | Detection of performance degradation in integrated circuits | Emily A. Ray, Emmanuel Yashchin, Peilin Song, Kevin G. Stawiasz, Barry P. Linder +4 more | 2021-08-31 |
| 10571520 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Franco Stellari, Peilin Song | 2020-02-25 |
| 10552278 | Non-destructive analysis to determine use history of processor | Keith A. Jenkins, Barry P. Linder, Emily A. Ray, Raphael P. Robertazzi, Peilin Song +4 more | 2020-02-04 |
| 10147175 | Detection of hardware trojan using light emissions with sacrificial mask | Andrea Bahgat Shehata, Peilin Song, Franco Stellari | 2018-12-04 |
| 10102090 | Non-destructive analysis to determine use history of processor | Keith A. Jenkins, Barry P. Linder, Emily A. Ray, Raphael P. Robertazzi, Peilin Song +4 more | 2018-10-16 |
| 9930325 | Minimum-spacing circuit design and layout for PICA | Herschel A. Ainspan, Seongwon Kim, Franco Stellari | 2018-03-27 |
| 9678152 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Franco Stellari, Peilin Song | 2017-06-13 |
| 9372231 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Franco Stellari, Peilin Song | 2016-06-21 |
| 9310429 | Method and apparatus for probing a wafer | Stephen Bradley Ippolito | 2016-04-12 |
| 9261561 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Franco Stellari, Peilin Song | 2016-02-16 |
| 9229044 | Minimum-spacing circuit design and layout for PICA | Herschel A. Ainspan, Seongwon Kim, Franco Stellari | 2016-01-05 |
| 9086457 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Franco Stellari, Peilin Song | 2015-07-21 |
| 9081049 | Minimum-spacing circuit design and layout for PICA | Herschel A. Ainspan, Seongwon Kim, Franco Stellari | 2015-07-14 |
| 8248097 | Method and apparatus for probing a wafer | Stephen Bradley Ippolito | 2012-08-21 |
| 8131056 | Constructing variability maps by correlating off-state leakage emission images to layout information | Stanislav Polonsky, Peilin Song, Franco Stellari | 2012-03-06 |
| 7886172 | Method of virtualization and OS-level thermal management and multithreaded processor with virtualization and OS-level thermal management | Pradip Bose, Chen-Yong Cher, Hubertus Franke, Hendrik F. Hamann, Eren Kursun | 2011-02-08 |
| 7788058 | Method and apparatus for diagnosing broken scan chain based on leakage light emission | Peilin Song, Tian Xia, Franco Stellari, Stanislav Polonsky | 2010-08-31 |
| 7698114 | Techniques for distributing power in electronic circuits and computer systems | Hendrik F. Hamann, James A. Lacey, Jamil A. Wakil | 2010-04-13 |
| 7477961 | Equivalent gate count yield estimation for integrated circuit devices | Thomas S. Barnett, Jeanne P. Bickford, William Y. Chang, Rashmi D. Chatty, Sebnem Jaji +4 more | 2009-01-13 |
| 7446550 | Enhanced signal observability for circuit analysis | Chandler McDowell, Stanislav Polonsky, Peilin Song, Franco Stellari | 2008-11-04 |
| 7426448 | Method and apparatus for diagnosing broken scan chain based on leakage light emission | Peilin Song, Tian Xia, Franco Stellari, Stanislav Polonsky | 2008-09-16 |
| 7355419 | Enhanced signal observability for circuit analysis | Chandler McDowell, Stanislav Polonsky, Peilin Song, Franco Stellari | 2008-04-08 |
| 7167806 | Method and system for measuring temperature and power distribution of a device | Hendrik F. Hamann, James A. Lacey, Martin P. O'Boyle, Robert J. von Gutfeld, Jamil A. Wakil | 2007-01-23 |
| 6963811 | Method and apparatus for improved detection of multisynchronous signals title | — | 2005-11-08 |
| 6943578 | Method and application of PICA (picosecond imaging circuit analysis) for high current pulsed phenomena | Naoko Pia Sanda, Steven H. Voldman | 2005-09-13 |