Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7590507 | Structure and method for monitoring variation within an active region of a semiconductor device using scaling | Sharon L. Von Bruns | 2009-09-15 |
| 7477961 | Equivalent gate count yield estimation for integrated circuit devices | Thomas S. Barnett, Jeanne P. Bickford, Rashmi D. Chatty, Sebnem Jaji, Kerry A. Kravec +4 more | 2009-01-13 |