Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10571520 | Scan chain latch design that improves testability of integrated circuits | Franco Stellari, Alan J. Weger, Peilin Song | 2020-02-25 |
| 9678152 | Scan chain latch design that improves testability of integrated circuits | Franco Stellari, Alan J. Weger, Peilin Song | 2017-06-13 |
| 9372231 | Scan chain latch design that improves testability of integrated circuits | Franco Stellari, Alan J. Weger, Peilin Song | 2016-06-21 |
| 9261561 | Scan chain latch design that improves testability of integrated circuits | Franco Stellari, Alan J. Weger, Peilin Song | 2016-02-16 |
| 9086457 | Scan chain latch design that improves testability of integrated circuits | Franco Stellari, Alan J. Weger, Peilin Song | 2015-07-21 |