EY

Emmanuel Yashchin

IBM: 30 patents #3,369 of 70,183Top 5%
Globalfoundries: 1 patents #2,221 of 4,424Top 55%
Overall (All Time): #115,451 of 4,157,543Top 3%
31
Patents All Time

Issued Patents All Time

Showing 25 most recent of 31 patents

Patent #TitleCo-InventorsDate
12293373 Associating disturbance events to accidents or tickets Nianjun Zhou, Anuradha Bhamidipaty, Dhavalkumar C. Patel, Arun Kwangil Iyengar, Shrey Shrivastava 2025-05-06
12248446 Data gap mitigation Nianjun Zhou, Dhavalkumar C. Patel, Arun Kwangil Iyengar, Shrey Shrivastava, Anuradha Bhamidipaty 2025-03-11
11105856 Detection of performance degradation in integrated circuits Emily A. Ray, Peilin Song, Kevin G. Stawiasz, Barry P. Linder, Alan J. Weger +4 more 2021-08-31
11054459 Optimization of integrated circuit reliability Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame +1 more 2021-07-06
10996259 Optimization of integrated circuit reliability Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame +1 more 2021-05-04
10989754 Optimization of integrated circuit reliability Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame +1 more 2021-04-27
10644982 Real-time data analytics for streaming data Donnie Haye, Eric V. Kline, Jeffrey G. Komatsu, Anthony C. Spielberg, Benjamin J. Steele +2 more 2020-05-05
10564214 Optimization of integrated circuit reliability Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame +1 more 2020-02-18
10552278 Non-destructive analysis to determine use history of processor Keith A. Jenkins, Barry P. Linder, Emily A. Ray, Raphael P. Robertazzi, Peilin Song +4 more 2020-02-04
10171334 Real-time data analytics for streaming data Donnie Haye, Eric V. Kline, Jeffrey G. Komatsu, Anthony C. Spielberg, Benjamin J. Steele +2 more 2019-01-01
10102090 Non-destructive analysis to determine use history of processor Keith A. Jenkins, Barry P. Linder, Emily A. Ray, Raphael P. Robertazzi, Peilin Song +4 more 2018-10-16
9985615 On-chip randomness generation Kai D. Feng, Ping-Chuan Wang, Zhijian Yang 2018-05-29
9739824 Optimization of integrated circuit reliability Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame +1 more 2017-08-22
9720101 Method of consumer/producer raw material selection Michael S. Gordon, Kenneth P. Rodbell 2017-08-01
9395403 Optimization of integrated circuit reliability Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame +1 more 2016-07-19
9299623 Run-to-run control utilizing virtual metrology in semiconductor manufacturing Robert J. Baseman, Jingrui He, Yada Zhu 2016-03-29
9240360 Run-to-run control utilizing virtual metrology in semiconductor manufacturing Robert J. Baseman, Jingrui He, Yada Zhu 2016-01-19
8991198 Cooling system control and servicing based on time-based variation of an operational variable Daniel J. Kearney, Rejean P. Levesque, K. Paul Muller, Andrew H. Vogel 2015-03-31
8925339 Cooling system control and servicing based on time-based variation of an operational variable Daniel J. Kearney, Rejean P. Levesque, K. Paul Muller, Andrew H. Vogel 2015-01-06
8909383 Proactive cooling of chips using workload information and controls Scott J. Hadderman, Daniel J. Kearney, Wei Huang, K. Paul Muller, William J. Rooney +3 more 2014-12-09
8887008 Maintenance planning and failure prediction from data observed within a time window Jonathan R. M. Hosking, Yada Zhu 2014-11-11
8880962 Maintenance planning and failure prediction from data observed within a time window Jonathan R. M. Hosking, Yada Zhu 2014-11-04
8799042 Distribution network maintenance planning Arun Hampapur, Jayant R. Kalagnanam, Yada Zhu 2014-08-05
7882500 Method and a system for composing an optimally-grained set of service functions Sophia Krasikov, John Morar, Senthilnathan Velayudham 2011-02-01
7752581 Design structure and system for identification of defects on circuits or other arrayed products Mary Lanzerotti, Christina Landers, Asya Takken, Brian Trapp 2010-07-06