Issued Patents All Time
Showing 25 most recent of 70 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11961895 | Gate stacks with multiple high-κ dielectric layers | Ruqiang Bao, Ravikumar Ramachandran, Shahab Siddiqui, Elnatan Mataev | 2024-04-16 |
| 11877458 | RRAM structures in the BEOL | Baozhen Li, Chih-Chao Yang, Vijay Narayanan | 2024-01-16 |
| 11647681 | Fabrication of phase change memory cell in integrated circuit | Baozhen Li, Chih-Chao Yang, Andrew Tae Kim | 2023-05-09 |
| 11276748 | Switchable metal insulator metal capacitor | Baozhen Li, Chih-Chao Yang, Andrew Tae Kim | 2022-03-15 |
| 11105856 | Detection of performance degradation in integrated circuits | Emily A. Ray, Emmanuel Yashchin, Peilin Song, Kevin G. Stawiasz, Alan J. Weger +4 more | 2021-08-31 |
| 10901025 | Measuring individual device degradation in CMOS circuits | Keith A. Jenkins | 2021-01-26 |
| 10840447 | Fabrication of phase change memory cell in integrated circuit | Baozhen Li, Chih-Chao Yang, Andrew Tae Kim | 2020-11-17 |
| 10782336 | BTI degradation test circuit | Keith A. Jenkins | 2020-09-22 |
| 10746785 | Dynamic predictor of semiconductor lifetime limits | Chen-Yong Cher, Keith A. Jenkins | 2020-08-18 |
| 10671958 | Analytics to determine customer satisfaction | Karthik Balakrishnan, Keith A. Jenkins | 2020-06-02 |
| 10622355 | Reduction of negative bias temperature instability | Takashi Ando | 2020-04-14 |
| 10608138 | Reducing dark current in germanium photodiodes by electrical over-stress | Jason S. Orcutt | 2020-03-31 |
| 10552278 | Non-destructive analysis to determine use history of processor | Keith A. Jenkins, Emily A. Ray, Raphael P. Robertazzi, Peilin Song, James H. Stathis +4 more | 2020-02-04 |
| 10433173 | Touch movement activation for gaining access beyond a restricted access gateway | Keith A. Jenkins | 2019-10-01 |
| 10388580 | On-chip combined hot carrier injection and bias temperature instability monitor | Keith A. Jenkins | 2019-08-20 |
| 10365702 | Autonomic supply voltage compensation for degradation of circuits over circuit lifetime | Chen-Yong Cher, Pierce I-Jen Chuang, Keith A. Jenkins | 2019-07-30 |
| 10360526 | Analytics to determine customer satisfaction | Karthik Balakrishnan, Keith A. Jenkins | 2019-07-23 |
| 10262934 | Three plate MIM capacitor via integrity verification | Andrew Tae Kim, Baozhen Li, Ernest Y. Wu | 2019-04-16 |
| 10249785 | Reducing dark current in germanium photodiodes by electrical over-stress | Jason S. Orcutt | 2019-04-02 |
| 10247769 | Measuring individual device degradation in CMOS circuits | Keith A. Jenkins | 2019-04-02 |
| 10236407 | Reducing dark current in germanium photodiodes by electrical over-stress | Jason S. Orcutt | 2019-03-19 |
| 10229873 | Three plate MIM capacitor via integrity verification | Andrew Tae Kim, Baozhen Li, Ernest Y. Wu | 2019-03-12 |
| 10192869 | Reduction of negative bias temperature instability | Takashi Ando | 2019-01-29 |
| 10134732 | Reduction of negative bias temperature instability | Takashi Ando | 2018-11-20 |
| 10102090 | Non-destructive analysis to determine use history of processor | Keith A. Jenkins, Emily A. Ray, Raphael P. Robertazzi, Peilin Song, James H. Stathis +4 more | 2018-10-16 |