Issued Patents All Time
Showing 26–50 of 70 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10103060 | Test structures for dielectric reliability evaluations | David G. Brochu, JR., Roger A. Dufresne, Baozhen Li, James H. Stathis, Ernest Y. Wu | 2018-10-16 |
| 10043938 | Reducing dark current in germanium photodiodes by electrical over-stress | Jason S. Orcutt | 2018-08-07 |
| 10002810 | On-chip combined hot carrier injection and bias temperature instability monitor | Keith A. Jenkins | 2018-06-19 |
| 9952274 | Measurement for transistor output characteristics with and without self heating | Keith A. Jenkins | 2018-04-24 |
| 9941371 | Selective thickening of pFET dielectric | Takashi Ando, Hemanth Jagannathan | 2018-04-10 |
| 9906960 | Touch movement activation for gaining access beyond a restricted access gateway | Keith A. Jenkins | 2018-02-27 |
| 9866221 | Test circuit to isolate HCI degradation | Keith A. Jenkins | 2018-01-09 |
| 9863994 | On-chip leakage measurement | Chen-Yong Cher, Keith A. Jenkins | 2018-01-09 |
| 9853179 | Reducing dark current in germanium photodiodes by electrical over-stress | Jason S. Orcutt | 2017-12-26 |
| 9831084 | Hydroxyl group termination for nucleation of a dielectric metallic oxide | Takashi Ando, Michael P. Chudzik, Min Dai, Martin M. Frank, David F. Hilscher +3 more | 2017-11-28 |
| 9791499 | Circuit to detect previous use of computer chips using passive test wires | Keith A. Jenkins, Kevin G. Stawiasz | 2017-10-17 |
| 9791500 | Circuit to detect previous use of computer chips using passive test wires | Keith A. Jenkins, Kevin G. Stawiasz | 2017-10-17 |
| 9755100 | Reducing dark current in germanium photodiodes by electrical over-stress | Jason S. Orcutt | 2017-09-05 |
| 9678141 | Measurement for transistor output characteristics with and without self heating | Keith A. Jenkins | 2017-06-13 |
| 9634116 | Method to improve reliability of high-K metal gate stacks | Takashi Ando, Eduard A. Cartier, Vijay Narayanan | 2017-04-25 |
| 9570569 | Selective thickening of PFET dielectric | Takashi Ando, Hemanth Jagannathan | 2017-02-14 |
| 9496183 | Selective thickening of pFET dielectric | Takashi Ando, Hemanth Jagannathan | 2016-11-15 |
| 9373501 | Hydroxyl group termination for nucleation of a dielectric metallic oxide | Takashi Ando, Michael P. Chudzik, Min Dai, Martin M. Frank, David F. Hilscher +3 more | 2016-06-21 |
| 9310424 | Monitoring aging of silicon in an integrated circuit device | Malcolm S. Allen-Ware, Ronald J. Bolam, Alan J. Drake, Charles R. Lefurgy, Steven W. Mittl +1 more | 2016-04-12 |
| 9299802 | Method to improve reliability of high-K metal gate stacks | Takashi Ando, Eduard A. Cartier, Vijay Narayanan | 2016-03-29 |
| 9287185 | Determining appropriateness of sampling integrated circuit test data in the presence of manufacturing variations | Griselda Bonilla, Baozhen Li, James H. Stathis, Ernest Y. Wu, Kai Zhao | 2016-03-15 |
| 9252232 | Multi-plasma nitridation process for a gate dielectric | Michael P. Chudzik, Shahab Siddiqui | 2016-02-02 |
| 9196700 | Multi-plasma nitridation process for a gate dielectric | Michael P. Chudzik, Shahab Siddiqui | 2015-11-24 |
| 9110777 | Reducing performance degradation in backup semiconductor chips | Aditya Bansal, Manjul Bhushan, Keith A. Jenkins, Jae-Joon Kim, Kai Zhao | 2015-08-18 |
| 9006064 | Multi-plasma nitridation process for a gate dielectric | Michael P. Chudzik, Shahab Siddiqui | 2015-04-14 |