Issued Patents All Time
Showing 25 most recent of 73 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11131706 | Degradation monitoring of semiconductor chips | — | 2021-09-28 |
| 11105856 | Detection of performance degradation in integrated circuits | Emily A. Ray, Emmanuel Yashchin, Peilin Song, Kevin G. Stawiasz, Barry P. Linder +4 more | 2021-08-31 |
| 10901025 | Measuring individual device degradation in CMOS circuits | Barry P. Linder | 2021-01-26 |
| 10782336 | BTI degradation test circuit | Barry P. Linder | 2020-09-22 |
| 10746785 | Dynamic predictor of semiconductor lifetime limits | Chen-Yong Cher, Barry P. Linder | 2020-08-18 |
| 10739391 | Duty cycle measurement | — | 2020-08-11 |
| 10671958 | Analytics to determine customer satisfaction | Karthik Balakrishnan, Barry P. Linder | 2020-06-02 |
| 10574240 | Ring oscillator structures to determine local voltage value | Peilin Song, James H. Stathis, Franco Stellari | 2020-02-25 |
| 10564213 | Dielectric breakdown monitor | Tam N. Huynh, Franco Stellari | 2020-02-18 |
| 10552278 | Non-destructive analysis to determine use history of processor | Barry P. Linder, Emily A. Ray, Raphael P. Robertazzi, Peilin Song, James H. Stathis +4 more | 2020-02-04 |
| 10491610 | Remote monitoring of software | Raphael P. Robertazzi, Alberto Valdes Garcia | 2019-11-26 |
| 10433173 | Touch movement activation for gaining access beyond a restricted access gateway | Barry P. Linder | 2019-10-01 |
| 10388580 | On-chip combined hot carrier injection and bias temperature instability monitor | Barry P. Linder | 2019-08-20 |
| 10365702 | Autonomic supply voltage compensation for degradation of circuits over circuit lifetime | Chen-Yong Cher, Pierce I-Jen Chuang, Barry P. Linder | 2019-07-30 |
| 10360526 | Analytics to determine customer satisfaction | Karthik Balakrishnan, Barry P. Linder | 2019-07-23 |
| 10295589 | Electromigration wearout detection circuits | Siyuranga O. Koswatta | 2019-05-21 |
| 10247769 | Measuring individual device degradation in CMOS circuits | Barry P. Linder | 2019-04-02 |
| 10102090 | Non-destructive analysis to determine use history of processor | Barry P. Linder, Emily A. Ray, Raphael P. Robertazzi, Peilin Song, James H. Stathis +4 more | 2018-10-16 |
| 10075131 | Ultra-broadband switched inductor oscillator | Shu-Jen Han | 2018-09-11 |
| 10002810 | On-chip combined hot carrier injection and bias temperature instability monitor | Barry P. Linder | 2018-06-19 |
| 9952274 | Measurement for transistor output characteristics with and without self heating | Barry P. Linder | 2018-04-24 |
| 9906960 | Touch movement activation for gaining access beyond a restricted access gateway | Barry P. Linder | 2018-02-27 |
| 9866221 | Test circuit to isolate HCI degradation | Barry P. Linder | 2018-01-09 |
| 9863994 | On-chip leakage measurement | Chen-Yong Cher, Barry P. Linder | 2018-01-09 |
| 9835583 | Remote sensing using pulse-width modulation | Shu-Jen Han | 2017-12-05 |