Issued Patents All Time
Showing 25 most recent of 33 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12197133 | Tool control using multistage LSTM for predicting on-wafer measurements | Dung Phan, Ramachandran Muralidhar, Fateh A. Tipu, Nam H. Nguyen | 2025-01-14 |
| 12073152 | Vehicle asset modeling using language processing methods | Elham Khabiri, Anuradha Bhamidipaty, Chandrasekhara K. Reddy, Srideepika Jayaraman | 2024-08-27 |
| 11954615 | Model management for non-stationary systems | Dung Phan, Fateh A. Tipu, Nam H. Nguyen, Ramachandran Muralidhar | 2024-04-09 |
| 11599690 | Wafer asset modeling using language processing methods | Elham Khabiri, Anuradha Bhamidipaty, Chandrasekhara K. Reddy, Srideepika Jayaraman | 2023-03-07 |
| 11410891 | Anomaly detection and remedial recommendation | Dzung Tien Phan, Nam H. Nguyen, Fateh A. Tipu, Ramachandran Muralidhar | 2022-08-09 |
| 11022965 | Controlling multi-stage manufacturing process based on internet of things (IOT) sensors and cognitive rule induction | Jayant R. Kalagnanam, Young-Min Lee, Jie Ma, Jian Wang, Guan Qun Zhang | 2021-06-01 |
| 10585425 | Controlling multi-stage manufacturing process based on internet of things (IOT) sensors and cognitive rule induction | Jayant R. Kalagnanam, Young-Min Lee, Jie Ma, Jian Wang, Guan Qun Zhang | 2020-03-10 |
| 10365640 | Controlling multi-stage manufacturing process based on internet of things (IoT) sensors and cognitive rule induction | Jayant R. Kalagnanam, Young-Min Lee, Jie Ma, Jian Wang, Guan Qun Zhang | 2019-07-30 |
| 9915942 | System and method for identifying significant and consumable-insensitive trace features | Amit Dhurandhar, Fateh A. Tipu | 2018-03-13 |
| 9395408 | System for wafer quality predictive modeling based on multi-source information with heterogeneous relatedness | Yada Zhu, Jingrui He | 2016-07-19 |
| 9299623 | Run-to-run control utilizing virtual metrology in semiconductor manufacturing | Jingrui He, Emmanuel Yashchin, Yada Zhu | 2016-03-29 |
| 9240360 | Run-to-run control utilizing virtual metrology in semiconductor manufacturing | Jingrui He, Emmanuel Yashchin, Yada Zhu | 2016-01-19 |
| 9176183 | Method and system for wafer quality predictive modeling based on multi-source information with heterogeneous relatedness | Yada Zhu, Jingrui He | 2015-11-03 |
| 8793106 | Continuous prediction of expected chip performance throughout the production lifecycle | Amit Dhurandhar, Sholom M. Weiss, Brian F. White | 2014-07-29 |
| 8732627 | Method and apparatus for hierarchical wafer quality predictive modeling | Jingrui He, Yada Zhu | 2014-05-20 |
| 8718809 | Comprehensive analysis of queue times in microelectronic manufacturing | Tomasz J. Nowicki | 2014-05-06 |
| 8639375 | Enhancing investigation of variability by inclusion of similar objects with known differences to the original ones | Tomasz J. Nowicki, Fateh A. Tipu | 2014-01-28 |
| 8594826 | Method and system for evaluating a machine tool operating characteristics | Ehud Aharoni, Ramona Kei, Oded Margalit, Kevin J. Mackey, Michal Rosen-Zvi +6 more | 2013-11-26 |
| 8594821 | Detecting combined tool incompatibilities and defects in semiconductor manufacturing | Fateh A. Tipu, Sholom M. Weiss | 2013-11-26 |
| 8533635 | Rule-based root cause and alias analysis for semiconductor manufacturing | Fateh A. Tipu, Sholom M. Weiss | 2013-09-10 |
| 8328950 | Foreign material contamination detection | Tomasz J. Nowicki | 2012-12-11 |
| 8315729 | Enhancing investigation of variability by inclusion of similar objects with known differences to the original ones | Tomasz J. Nowicki, Fateh A. Tipu | 2012-11-20 |
| 8285414 | Method and system for evaluating a machine tool operating characteristics | Ehud Aharoni, Ramona Kei, Oded Margalit, Kevin J. Mackey, Michal Rosen-Zvi +6 more | 2012-10-09 |
| 7962302 | Predicting wafer failure using learned probability | Susan G. Conti, William A. Muth, Michal Rosen-Zvi, Frederick A. Scholl | 2011-06-14 |
| 7650251 | System and method for rule-based data mining and problem detection for semiconductor fabrication | Fateh A. Tipu, Sholom M. Weiss | 2010-01-19 |