Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12197133 | Tool control using multistage LSTM for predicting on-wafer measurements | Dung Phan, Robert J. Baseman, Ramachandran Muralidhar, Nam H. Nguyen | 2025-01-14 |
| 11954615 | Model management for non-stationary systems | Dung Phan, Robert J. Baseman, Nam H. Nguyen, Ramachandran Muralidhar | 2024-04-09 |
| 11410891 | Anomaly detection and remedial recommendation | Dzung Tien Phan, Robert J. Baseman, Nam H. Nguyen, Ramachandran Muralidhar | 2022-08-09 |
| 9915942 | System and method for identifying significant and consumable-insensitive trace features | Robert J. Baseman, Amit Dhurandhar | 2018-03-13 |
| 8639375 | Enhancing investigation of variability by inclusion of similar objects with known differences to the original ones | Robert J. Baseman, Tomasz J. Nowicki | 2014-01-28 |
| 8594821 | Detecting combined tool incompatibilities and defects in semiconductor manufacturing | Robert J. Baseman, Sholom M. Weiss | 2013-11-26 |
| 8533635 | Rule-based root cause and alias analysis for semiconductor manufacturing | Robert J. Baseman, Sholom M. Weiss | 2013-09-10 |
| 8315729 | Enhancing investigation of variability by inclusion of similar objects with known differences to the original ones | Robert J. Baseman, Tomasz J. Nowicki | 2012-11-20 |
| 7650251 | System and method for rule-based data mining and problem detection for semiconductor fabrication | Robert J. Baseman, Sholom M. Weiss | 2010-01-19 |
| 7561158 | Method and apparatus for presenting feature importance in predictive modeling | Naoki Abe, Edwin Peter Dawson Pednault | 2009-07-14 |
| 7539585 | System and method for rule-based data mining and problem detection for semiconductor fabrication | Robert J. Baseman, Sholom M. Weiss | 2009-05-26 |
| 5970464 | Data mining based underwriting profitability analysis | Chidanand Apte, Edna Grossman, Edwin Peter Dawson Pednault, Barry K. Rosen, Hsueh-ju Wang +1 more | 1999-10-19 |