CG

Carole D. Graas

IBM: 15 patents #7,450 of 70,183Top 15%
TI Texas Instruments: 4 patents #3,281 of 12,488Top 30%
Globalfoundries: 2 patents #1,397 of 4,424Top 35%
Disney: 1 patents #3,944 of 6,686Top 60%
Overall (All Time): #194,433 of 4,157,543Top 5%
22
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11054459 Optimization of integrated circuit reliability Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame, Ernest Y. Wu +1 more 2021-07-06
11031358 Overhang model for reducing passivation stress and method for producing the same Aarthi Sridharan, Gong Cheng, Premachandran CHIRAYARIKATHUVEEDU, Fahad Mirza, Sricharan Tubati +1 more 2021-06-08
10996259 Optimization of integrated circuit reliability Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame, Ernest Y. Wu +1 more 2021-05-04
10989754 Optimization of integrated circuit reliability Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame, Ernest Y. Wu +1 more 2021-04-27
10900923 Moisture detection and ingression monitoring systems and methods of manufacture Fen Chen, Jeffrey P. Gambino, Wen Liu, Prakash Periasamy 2021-01-26
10564214 Optimization of integrated circuit reliability Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame, Ernest Y. Wu +1 more 2020-02-18
10545110 Moisture detection and ingression monitoring systems and methods of manufacture Fen Chen, Jeffrey P. Gambino, Wen Liu, Prakash Periasamy 2020-01-28
10545111 Moisture detection and ingression monitoring systems and methods of manufacture Fen Chen, Jeffrey P. Gambino, Wen Liu, Prakash Periasamy 2020-01-28
10388567 Thru-silicon-via structures Fen Chen, Mukta G. Farooq, Xiao Hu Liu 2019-08-20
10324056 Moisture detection and ingression monitoring systems and methods of manufacture Fen Chen, Jeffrey P. Gambino, Wen Liu, Prakash Periasamy 2019-06-18
10309919 Moisture detection and ingression monitoring systems and methods of manufacture Fen Chen, Jeffrey P. Gambino, Wen Liu, Prakash Periasamy 2019-06-04
10126260 Moisture detection and ingression monitoring systems and methods of manufacture Fen Chen, Jeffrey P. Gambino, Wen Liu, Prakash Periasamy 2018-11-13
9812359 Thru-silicon-via structures Fen Chen, Mukta G. Farooq, Xiao Hu Liu 2017-11-07
9739824 Optimization of integrated circuit reliability Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame, Ernest Y. Wu +1 more 2017-08-22
9395403 Optimization of integrated circuit reliability Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame, Ernest Y. Wu +1 more 2016-07-19
8729920 Circuit and method for RAS-enabled and self-regulated frequency and delay sensor Keith A. Jenkins, Pascal A. Nsame, Kevin G. Stawiasz 2014-05-20
8201038 Integrating design for reliability technology into integrated circuits Pascal A. Nsame 2012-06-12
6603321 Method and apparatus for accelerated determination of electromigration characteristics of semiconductor wiring Ronald G. Filippi, Alvin W. Strong, Timothy D. Sullivan, Deborah Tibel, Michael Ruprecht 2003-08-05
6570181 Semiconductor metal interconnect reliability test structure Larry Ting 2003-05-27
6566211 Surface modified interconnects Robert H. Havemann 2003-05-20
6355983 Surface modified interconnects Robert H. Havemann 2002-03-12
5360995 Buffered capped interconnect for a semiconductor device 1994-11-01