| 7667513 |
Digital duty cycle corrector |
Gary Dale Carpenter, Alan J. Drake, Fadi H. Gebara, Hung C. Ngo |
2010-02-23 |
| 7622942 |
Method and apparatus for measuring device mismatches |
Kanak B. Agarwal, Ying Liu, Sani R. Nassif, James Plusquellic, Jayakumaran Sivagnaname |
2009-11-24 |
| 7446550 |
Enhanced signal observability for circuit analysis |
Stanislav Polonsky, Peilin Song, Franco Stellari, Alan J. Weger |
2008-11-04 |
| 7408372 |
Method and apparatus for measuring device mismatches |
Kanak B. Agarwal, Ying Liu, Sani R. Nassif, James Plusquellic, Jayakumaran Sivagnaname |
2008-08-05 |
| 7383480 |
Scanning latches using selecting array |
Andrew K. Martin, Robert K. Montoye, Jun Sawada |
2008-06-03 |
| 7355419 |
Enhanced signal observability for circuit analysis |
Stanislav Polonsky, Peilin Song, Franco Stellari, Alan J. Weger |
2008-04-08 |
| 7284029 |
4-to-2 carry save adder using limited switching dynamic logic |
Wendy A. Belluomini, Ramyanshu Datta, Robert K. Montoye, Hung C. Ngo |
2007-10-16 |
| 7216141 |
Computing carry-in bit to most significant bit carry save adder in current stage |
Wendy A. Belluomini, Ramyanshu Datta, Jente B. Kuang, Robert K. Montoye, Hung C. Ngo |
2007-05-08 |
| 7047468 |
Method and apparatus for low overhead circuit scan |
Wendy A. Belluomini, Andrew K. Martin, Robert K. Montoye |
2006-05-16 |
| 7046094 |
Method and ring oscillator circuit for measuring circuit delays over a wide operating range |
Wendy A. Belluomini, Andrew K. Martin |
2006-05-16 |
| 6866415 |
Scanning heat flow probe |
Steven A. Cordes, David R. DiMilia, James P. Doyle, Matthew J. Farinelli, Snigdha Ghoshal +2 more |
2005-03-15 |
| 6817761 |
Scanning heat flow probe |
Steven A. Cordes, David R. DiMilia, James P. Doyle, Matthew J. Farinelli, Snigdha Ghoshal +2 more |
2004-11-16 |
| 6769774 |
Ambient light tolerant image projection method and system |
— |
2004-08-03 |
| 6754092 |
Method and apparatus for reducing power consumption for power supplied by a voltage adapter |
Sani R. Nassif |
2004-06-22 |
| 6731129 |
Apparatus for measuring capacitance of a semiconductor device |
Wendy A. Belluomini, Sani R. Nassif, Ying Liu |
2004-05-04 |
| 6679625 |
Scanning heat flow probe |
Steven A. Cordes, David R. DiMilia, James P. Doyle, Matthew J. Farinelli, Snigdha Ghoshal +2 more |
2004-01-20 |
| 6652139 |
Scanning heat flow probe and the method of fabricating the same |
Steven A. Cordes, David R. DiMilia, James P. Doyle, Matthew J. Farinelli, Snigdha Ghoshal +2 more |
2003-11-25 |
| 6494048 |
Assembly of quantum cold point thermoelectric coolers using magnets |
Uttam Shyamalindu Ghoshal |
2002-12-17 |
