Issued Patents All Time
Showing 1–25 of 76 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11372701 | Statistical design with importance sampling reuse | Rajiv V. Joshi, Rouwaida N. Kanj, Carl Radens | 2022-06-28 |
| 10737114 | Translating different clinical protocols for particle therapy into a set of constraints | Anne Elizabeth Gattiker, Tom Osiecki, Chin Ngai Sze | 2020-08-11 |
| 10474774 | Power and performance sorting of microprocessors from first interconnect layer to wafer final test | Emrah Acar, Moyra K. McManus, Matthew J. Sullivan | 2019-11-12 |
| 10387235 | Statistical design with importance sampling reuse | Rajiv V. Joshi, Rouwaida N. Kanj, Carl Radens | 2019-08-20 |
| 9999788 | Fast and accurate proton therapy dose calculations | Anne Elizabeth Gattiker, Damir A. Jamsek, Thomas H. Osiecki, William E. Speight, Chin Ngai Sze +1 more | 2018-06-19 |
| 9987502 | Radiation therapy treatment planning using regression | Anne Elizabeth Gattiker, Tom Osiecki, Chin Ngai Sze | 2018-06-05 |
| 9987501 | Extracting protobeams for cancer radiation therapy | Anne Elizabeth Gattiker, Damir A. Jamsek, Tom Osiecki, Chin Ngai Sze | 2018-06-05 |
| 9946824 | Efficient Ceff model for gate output slew computation in early synthesis | Charles J. Alpert, Zhuo Li, Yilin Zhang, Ying Zhou | 2018-04-17 |
| 9507250 | Optical proximity correction for improved electrical characteristics | Kanak B. Agarwal | 2016-11-29 |
| 9471732 | Equivalent device statistical modeling for bitline leakage modeling | Rajiv V. Joshi, Rouwaida N. Kanj | 2016-10-18 |
| 9348680 | Statistical design with importance sampling reuse | Rajiv V. Joshi, Rouwaida N. Kanj, Carl Radens | 2016-05-24 |
| 9135577 | Statistical determination of power-circuit connectivity | Wael R. El-Essawy, Alexandre Peixoto Ferreira, Thomas Walter Keller, Karthick Rajamani, Juan C. Rubio | 2015-09-15 |
| 8914272 | Visualizing sensitivity information in integrated circuit design | Anne Elizabeth Gattiker | 2014-12-16 |
| 8862426 | Method and test system for fast determination of parameter variation statistics | Kanak B. Agarwal, Jerry D. Hayes | 2014-10-14 |
| 8799732 | Methodology for correlated memory fail estimations | Rajiv V. Joshi, Rouwaida N. Kanj | 2014-08-05 |
| 8742748 | Calibration of non-contact current sensors | Wael R. El-Essawy, Alexandre Peixoto Ferreira, Thomas Walter Keller | 2014-06-03 |
| 8676516 | Test circuit for bias temperature instability recovery measurements | Fadi H. Gebara, Jerry D. Hayes, John P. Keane, Jeremy D. Schaub | 2014-03-18 |
| 8640062 | Rapid estimation of temperature rise in wires due to Joule heating | Kanak B. Agarwal, Ronald D. Rose, Chenggang Xu | 2014-01-28 |
| 8594989 | Compensating for variations in device characteristics in integrated circuit simulation | Emrah Acar, Kanak B. Agarwal, Damir A. Jamsek | 2013-11-26 |
| 8595664 | Guiding design actions for complex failure modes | Anne Elizabeth Gattiker | 2013-11-26 |
| 8595665 | Guiding design actions for complex failure modes | Ann Elizabeth Gattiker | 2013-11-26 |
| 8539421 | Layout-specific classification and prioritization of recommended rules violations | Kanak B. Agarwal | 2013-09-17 |
| 8516403 | Multiple patterning layout decomposition for ease of conflict removal | Rani S. Abou Ghaida, Kanak B. Agarwal, Lars Liebmann | 2013-08-20 |
| 8508212 | Calibration of non-contact current sensors | Wael R. El-Essawy, Alexandre Peixoto Ferreira, Thomas Walter Keller | 2013-08-13 |
| 8495524 | Gradient-based search mechanism for optimizing photolithograph masks | Ying Liu, Xiaokang Shi | 2013-07-23 |