Issued Patents All Time
Showing 26–50 of 76 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8493054 | Calibration of non-contact voltage sensors | Wael R. El-Essawy, Alexandre Peixoto Ferreira, Thomas Walter Keller | 2013-07-23 |
| 8495524 | Gradient-based search mechanism for optimizing photolithograph masks | Ying Liu, Xiaokang Shi | 2013-07-23 |
| 8473879 | On-chip leakage current modeling and measurement circuit | Rajiv V. Joshi, Rousaida N. Kanj, Jente B. Kuang | 2013-06-25 |
| 8473872 | Gradient-based search mechanism for optimizing photolithograph masks | Ying Liu, Xiaokang Shi | 2013-06-25 |
| 8458620 | Gradient-based search mechanism for optimizing photolithograph masks | Ying Liu, Xiaokang Shi | 2013-06-04 |
| 8453074 | Gradient based search mechanism for optimizing photolithograph masks | Ying Liu, Xiaokang Shi | 2013-05-28 |
| 8434033 | Mask assignment for multiple patterning lithography | Rani S. Abou Ghaida, Kanak B. Agarwal, Lars Liebmann | 2013-04-30 |
| 8402398 | Reducing through process delay variation in metal wires | Kanak B. Agarwal, Shayak Banerjee | 2013-03-19 |
| 8365118 | Broken-spheres methodology for improved failure probability analysis in multi-fail regions | Rajiv V. Joshi, Rouwaida N. Kanj, Zhuo Li | 2013-01-29 |
| 8347240 | Split-layer design for double patterning lithography | Kanak B. Agarwal, Lars Liebmann | 2013-01-01 |
| 8346528 | Equivalent device statistical modeling for bitline leakage modeling | Rajiv V. Joshi, Rouwaida N. Kanj | 2013-01-01 |
| 8321818 | Model-based retargeting of layout patterns for sub-wavelength photolithography | Kanak B. Agarwal, Shayak Banerjee | 2012-11-27 |
| 8281263 | Propagating design tolerances to shape tolerances for lithography | Kanak B. Agarwal, Shayak Banerjee, Chin Ngai Sze | 2012-10-02 |
| 8245159 | Gradient based search mechanism for optimizing photolithograph masks | Ying Liu, Xiaokang Shi | 2012-08-14 |
| 8229683 | Test circuit for bias temperature instability recovery measurements | Fadi H. Gebara, Jerry D. Hayes, John P. Keane, Jeremy D. Schaub | 2012-07-24 |
| 8214777 | On-chip leakage current modeling and measurement circuit | Rajiv V. Joshi, Rouwaida N. Kanj, Jente B. Kuang | 2012-07-03 |
| 8214190 | Methodology for correlated memory fail estimations | Rajiv V. Joshi, Rouwaida N. Kanj | 2012-07-03 |
| 8208339 | Computer program product for controlling a storage device having per-element selectable power supply voltages | Rajiv V. Joshi, Jente B. Kuang, Rouwaida N. Kanj, Hung C. Ngo | 2012-06-26 |
| 8151230 | Blended model interpolation | Emrah Acar, Damir A. Jamsek | 2012-04-03 |
| 8121822 | Integrated circuit modeling based on empirical test data | Emrah Acar, Kanak B. Agarwal, Damir A. Jamsek | 2012-02-21 |
| 7995418 | Method and computer program for controlling a storage device having per-element selectable power supply voltages | Rajiv V. Joshi, Jente B. Kuang, Rouwaida N. Kanj, Hung C. Ngo | 2011-08-09 |
| 7949482 | Delay-based bias temperature instability recovery measurements for characterizing stress degradation and recovery | Fadi H. Gebara, Jerry D. Hayes, John P. Keane, Jeremy D. Schaub | 2011-05-24 |
| 7917316 | Test system and computer program for determining threshold voltage variation using a device array | Kanak B. Agarwal | 2011-03-29 |
| 7885798 | Closed-loop modeling of gate leakage for fast simulators | Rajiv V. Joshi, Rouwaida N. Kanj, Ying Liu, Jayakumaran Sivagnaname | 2011-02-08 |
| 7827018 | Method and computer program for selecting circuit repairs using redundant elements with consideration of aging effects | Chad A. Adams, Rajiv V. Joshi, Rouwaida N. Kanj | 2010-11-02 |