Issued Patents All Time
Showing 51–75 of 76 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7818137 | Characterization circuit for fast determination of device capacitance variation | Kanak B. Agarwal, Jerry D. Hayes | 2010-10-19 |
| 7759991 | Scannable virtual rail ring oscillator circuit and system for measuring variations in device characteristics | Kanak B. Agarwal | 2010-07-20 |
| 7759963 | Method for determining threshold voltage variation using a device array | Kanak B. Agarwal | 2010-07-20 |
| 7752580 | Method and system for analyzing an integrated circuit based on sample windows selected using an open deterministic sequencing technique | Sarah C. Braasch, Jason D. Hibbeler, Rouwaida N. Kanj, Daniel N. Maynard, Evanthia Papadopoulou | 2010-07-06 |
| 7733720 | Method and system for determining element voltage selection control values for a storage device | Rajiv V. Joshi, Jente B. Kuang, Rouwaida N. Kanj, Hung C. Ngo | 2010-06-08 |
| 7622942 | Method and apparatus for measuring device mismatches | Kanak B. Agarwal, Ying Liu, Chandler McDowell, James Plusquellic, Jayakumaran Sivagnaname | 2009-11-24 |
| 7560951 | Characterization array circuit | Kanak B. Agarwal | 2009-07-14 |
| 7550987 | Method and circuit for measuring operating and leakage current of individual blocks within an array of test circuit blocks | Dhruva J. Acharyya, Rahul M. Rao | 2009-06-23 |
| 7551508 | Energy efficient storage device using per-element selectable power supply voltages | Rajiv V. Joshi, Jente B. Kuang, Rouwaida N. Kanj, Hung C. Ngo | 2009-06-23 |
| 7532078 | Scannable virtual rail method and ring oscillator circuit for measuring variations in device characteristics | Kanak B. Agarwal | 2009-05-12 |
| 7447606 | Method of separating the process variation in threshold voltage and effective channel length by electrical measurements | Kanak B. Agarwal | 2008-11-04 |
| 7423446 | Characterization array and method for determining threshold voltage variation | Kanak B. Agarwal | 2008-09-09 |
| 7408372 | Method and apparatus for measuring device mismatches | Kanak B. Agarwal, Ying Liu, Chandler McDowell, James Plusquellic, Jayakumaran Sivagnaname | 2008-08-05 |
| 7380225 | Method and computer program for efficient cell failure rate estimation in cell arrays | Rajiv V. Joshi, Rouwaida N. Kanj | 2008-05-27 |
| 7350170 | System and method for memory element characterization | Bhavna Agrawal, Peter Feldmann, Tomasz J. Nowicki, Grzegorz Michal Swirszcz | 2008-03-25 |
| 7251581 | Circuit for computing moment pre-products for statistical analysis | — | 2007-07-31 |
| 7191113 | Method and system for short-circuit current modeling in CMOS integrated circuits | Emrah Acar, Ravishankar Arunachalam | 2007-03-13 |
| 7171333 | On-wafer method and apparatus for pre-processing measurements of process and environment-dependent circuit performance variables for statistical analysis | — | 2007-01-30 |
| 7137080 | Method for determining and using leakage current sensitivities to optimize the design of an integrated circuit | Emrah Acar, Anirudh Devgan | 2006-11-14 |
| 6898769 | Decoupling capacitor sizing and placement | Haihua Su | 2005-05-24 |
| 6842714 | Method for determining the leakage power for an integrated circuit | Emrah Acar, Anirudh Devgan, Ying Liu, Haihua Su | 2005-01-11 |
| 6769100 | Method and system for power node current waveform modeling | Emrah Acar | 2004-07-27 |
| 6754092 | Method and apparatus for reducing power consumption for power supplied by a voltage adapter | Chandler McDowell | 2004-06-22 |
| 6731129 | Apparatus for measuring capacitance of a semiconductor device | Wendy A. Belluomini, Chandler McDowell, Ying Liu | 2004-05-04 |
| 6384649 | Apparatus and method for clock skew measurement | David William Boerstler | 2002-05-07 |