Issued Patents All Time
Showing 1–25 of 35 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9356163 | Structure and method of integrating waveguides, photodetectors and logic devices | Fei Liu, Christine Qiqing Ouyang, Alexander Reznicek | 2016-05-31 |
| 9009415 | Memory system including a spiral cache | Fadi H. Gebara, Volker Strumpen | 2015-04-14 |
| 8880954 | Temperature-profiled device fingerprint generation and authentication from power-up states of static cells | Fadi H. Gebara, Joonsoo Kim, Volker Strumpen | 2014-11-04 |
| 8676516 | Test circuit for bias temperature instability recovery measurements | Fadi H. Gebara, Jerry D. Hayes, John P. Keane, Sani R. Nassif | 2014-03-18 |
| 8543768 | Memory system including a spiral cache | Fadi H. Gebara, Volker Strumpen | 2013-09-24 |
| 8539185 | Systolic networks for a spiral cache | Fadi H. Gebara, Volker Strumpen | 2013-09-17 |
| 8495431 | Temperature-profiled device fingerprint generation and authentication from power-up states of static cells | Fadi H. Gebara, Joonsoo Kim, Volker Strumpen | 2013-07-23 |
| 8229683 | Test circuit for bias temperature instability recovery measurements | Fadi H. Gebara, Jerry D. Hayes, John P. Keane, Sani R. Nassif | 2012-07-24 |
| 8219857 | Temperature-profiled device fingerprint generation and authentication from power-up states of static cells | Fadi H. Gebara, Joonsoo Kim, Volker Strumpen | 2012-07-10 |
| 8111090 | Voltage comparator having improved kickback and jitter characteristics | Fadi H. Gebara | 2012-02-07 |
| 8063424 | Embedded photodetector apparatus in a 3D CMOS chip stack | Fadi H. Gebara, Tak H. Ning, Qiqing C. Ouyang | 2011-11-22 |
| 7977618 | Testing of transimpedance amplifiers | John Andrew Guckenberger, Young Hoon Kwark | 2011-07-12 |
| 7949482 | Delay-based bias temperature instability recovery measurements for characterizing stress degradation and recovery | Fadi H. Gebara, Jerry D. Hayes, John P. Keane, Sani R. Nassif | 2011-05-24 |
| 7930120 | System and circuit for determining data signal jitter via asynchronous sampling | Hayden C. Cranford, Jr., Fadi H. Gebara | 2011-04-19 |
| 7915653 | Structure for and method of fabricating a high-speed CMOS-compatible Ge-on-insulator photodetector | Jack O. Chu, Gabriel Dehlinger, Alfred Grill, Steven J. Koester, Qiqing C. Ouyang | 2011-03-29 |
| 7885540 | Methods and apparatus for optical modulation amplitude measurement | Casimer M. DeCusatis, Daniel M. Kuchta | 2011-02-08 |
| 7883277 | Interconnecting (mapping) a two-dimensional optoelectronic (OE) device array to a one-dimensional waveguide array | Russell A. Budd, Punit P. Chiniwalla, John Andrew Guckenberger, Jeffrey A. Kash, Michael R. T. Tan +2 more | 2011-02-08 |
| 7792649 | System and circuit for constructing a synchronous signal diagram from asynchronously sampled data | Hayden C. Cranford, Jr., Fadi H. Gebara | 2010-09-07 |
| 7745775 | Testing of transimpedance amplifiers | John Andrew Guckenberger, Young Hoon Kwark | 2010-06-29 |
| 7684478 | Generating an eye diagram of integrated circuit transmitted signals | Hayden C. Cranford, Jr., Fadi H. Gebara | 2010-03-23 |
| 7570082 | Voltage comparator apparatus and method having improved kickback and jitter characteristics | Fadi H. Gebara | 2009-08-04 |
| 7548823 | Correction of delay-based metric measurements using delay circuits having differing metric sensitivities | Harmander Singh, Alan J. Drake, Fadi H. Gebara, John P. Keane, Robert M. Senger | 2009-06-16 |
| 7542862 | Calibration of multi-metric sensitive delay measurement circuits | Harmander Singh, Alan J. Drake, Fadi H. Gebara, John P. Keane, Robert M. Senger | 2009-06-02 |
| 7510904 | Structure for and method of fabricating a high-speed CMOS-compatible Ge-on-insulator photodetector | Jack O. Chu, Gabriel Dehlinger, Alfred Grill, Steven J. Koester, Qiqing C. Ouyang | 2009-03-31 |
| 7478011 | Method and system for measuring signal characteristics of data signals transmitted between integrated circuit chips | Fadi H. Gebara | 2009-01-13 |