| 8606060 |
Method and apparatus for dynamic manipulation and dispersion in photonic crystal devices |
Hendrik F. Hamann, Sharee McNab, Yurii A. Vlasov |
2013-12-10 |
| 8518766 |
Method of forming switching device having a molybdenum oxynitride metal gate |
Nestor A. Bojarczuk, Michael P. Chudzik, Matthew W. Copel, Supratik Guha, Richard A. Haight +2 more |
2013-08-27 |
| 7756667 |
Apparatus for three-dimensional measurements of physical characteristics within a data center |
Hendrik F. Hamann, Madhusudan K. Iyengar, James A. Lacey, Roger R. Schmidt |
2010-07-13 |
| 7739073 |
Method and apparatus for three-dimensional measurements of physical characteristics within a data center |
Hendrik F. Hamann, Madhusudan K. Iyengar, James A. Lacey, Roger R. Schmidt |
2010-06-15 |
| 7366632 |
Method and apparatus for three-dimensional measurements |
Hendrik F. Hamann, Madhusudan K. Iyengar, James A. Lacey, Roger R. Schmidt |
2008-04-29 |
| 7167806 |
Method and system for measuring temperature and power distribution of a device |
Hendrik F. Hamann, James A. Lacey, Robert J. von Gutfeld, Jamil A. Wakil, Alan J. Weger |
2007-01-23 |
| 7130141 |
Assembly for thermal and/or thermally-assisted information processing |
S. Jay Chey, Hendrik F. Hamann, H. Kumar Wickramasinghe |
2006-10-31 |
| 7129560 |
Thermal memory cell and memory device including the thermal memory cell |
Hendrik F. Hamann, H. Kumar Wickramasinghe |
2006-10-31 |
| 7068865 |
Method and apparatus for thermo-optic modulation of optical signals |
Hendrik F. Hamann, Sharee McNab, Yurii A. Vlasov |
2006-06-27 |
| 6567172 |
System and multipass probe for optical interference measurements |
Philip Charles Danby Hobbs, Richard J. Lebel, Theodore G. van Kessel, Hemantha K. Wickramasinghe |
2003-05-20 |
| 6334807 |
Chemical mechanical polishing in-situ end point system |
Richard J. Lebel, Rock Nadeau, Paul Smith, Theodore G. van Kessel, Hemantha K. Wickramasinghe |
2002-01-01 |
| 5646731 |
Interferometric detecting/imaging method based on multi-pole sensing |
Hemantha K. Wickramasinghe, Frederic Zenhausern, Yves Martin |
1997-07-08 |
| 5640242 |
Assembly and method for making in process thin film thickness measurments |
John Charles Panner, Thomas E. Sandwick, Theodore G. van Kessel, Hemantha K. Wickramasinghe |
1997-06-17 |
| 5623339 |
Interferometric measuring method based on multi-pole sensing |
Hemantha K. Wickramasinghe, Frederic Zenhausern |
1997-04-22 |
| 5623338 |
Interferometric near-field apparatus based on multi-pole sensing |
Hemantha K. Wickramasinghe, Frederic Zenhausern, Yves Martin |
1997-04-22 |
| 5298975 |
Combined scanning force microscope and optical metrology tool |
Henri A. Khoury, Calvin K. Chi, Joachim Clabes, Philip Charles Danby Hobbs, Laszlo Landstein +2 more |
1994-03-29 |
| 5267471 |
Double cantilever sensor for atomic force microscope |
David W. Abraham |
1993-12-07 |
