JC

Joachim Clabes

IBM: 18 patents #6,125 of 70,183Top 9%
Overall (All Time): #258,067 of 4,157,543Top 7%
18
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8365120 Resolving global coupling timing and slew violations for buffer-dominated designs Charles J. Alpert, Zhuo Li, Tuhin Mahmud, Stephen T. Quay 2013-01-29
7657772 Thermally aware integrated circuit Michael Stephen Floyd, Paul D. Muench, Lawrence Powell 2010-02-02
7051221 Performance throttling for temperature reduction in a microprocessor Michael Stephen Floyd, Ronald Nick Kalla, Balaram Sinharoy 2006-05-23
7044633 Method to calibrate a chip with multiple temperature sensitive ring oscillators by calibrating only TSRO Lawrence Powell, Daniel Stasiak, Michael Fan Wang 2006-05-16
6951002 Design techniques for analyzing integrated circuit device characteristics Anand Haridass, Michael Fan Wang 2005-09-27
6934658 Computer chip heat responsive method and apparatus Lawrence Powell, Daniel Stasiak, Michael Fan Wang 2005-08-23
6922818 Method of power consumption reduction in clocked circuits Sam Gat-Shang Chu, Michael N. Goulet, Thomas E. Rosser, James D. Warnock 2005-07-26
6914764 On-chip thermal sensing circuit Ronald Nick Kalla, Stephen Douglas Weitzel 2005-07-05
6901546 Enhanced debug scheme for LBIST Sam Gat-Shang Chu, Michael N. Goulet, Johnny LeBlanc, James D. Warnock 2005-05-31
6879928 Method and apparatus to dynamically recalibrate VLSI chip thermal sensors through software control Lawrence Powell, Daniel Stasiak, Michael Fan Wang, Balaram Sinharoy, Michael Stephen Floyd 2005-04-12
6865722 Method of automating chip power consumption estimation calculation Howard H. Chen, Gricell Co, James Scott Neely, Michael Fan Wang 2005-03-08
6728944 Method, system, and computer program product for improving wireability near dense clock nets Thomas E. Rosser 2004-04-27
6654943 Method, system, and computer program product for correcting anticipated problems related to global routing Thomas E. Rosser 2003-11-25
5345816 Integrated tip strain sensor for use in combination with a single axis atomic force microscope Henri A. Khoury, Laszlo Landstein 1994-09-13
5321977 Integrated tip strain sensor for use in combination with a single axis atomic force microscope Henri A. Khoury, Laszlo Landstein 1994-06-21
5298975 Combined scanning force microscope and optical metrology tool Henri A. Khoury, Calvin K. Chi, Philip Charles Danby Hobbs, Laszlo Landstein, Martin P. O'Boyle +2 more 1994-03-29
5171992 Nanometer scale probe for an atomic force microscope, and method for making same Michael Hatzakis, Kam-Leung Lee, Bojan Petek, John Casimir Slonczewski 1992-12-15
4886681 Metal-polymer adhesion by low energy bombardment Peter O. Hahn, Paul S. Ho, Haralambos Lefakis, Gary W. Rubloff 1989-12-12