WH

William J. Hurley

IBM: 7 patents #14,640 of 70,183Top 25%
Overall (All Time): #748,042 of 4,157,543Top 20%
7
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7930601 AC ABIST diagnostic method, apparatus and program product Joseph Eckelman, Donato O. Forlenza, Orazio P. Forlenza, Thomas J. Knips, Gary W. Maier +1 more 2011-04-19
7475308 implementing deterministic based broken scan chain diagnostics Adrian C. Anderson, Todd Burdine, Donato O. Forlenza, Orazio P. Forlenza, Phong T. Tran 2009-01-06
7395469 Method for implementing deterministic based broken scan chain diagnostics Adrian C. Anderson, Todd Burdine, Donato O. Forlenza, Orazio P. Forlenza, Phong T. Tran 2008-07-01
7395470 Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain Todd Burdine, Donato O. Forlenza, Orazio P. Forlenza, Phong T. Tran 2008-07-01
7392449 Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain Todd Burdine, Donato O. Forlenza, Orazio P. Forlenza, Phong T. Tran 2008-06-24
7225374 ABIST-assisted detection of scan chain defects Todd Burdine, Donato O. Forlenza, Orazio P. Forlenza, Steven Michnowski, James Webb 2007-05-29
7117415 Automated BIST test pattern sequence generator software system and method Donato O. Forlenza, Orazio P. Forlenza, Bryan J. Robbins 2006-10-03