| 11657887 |
Testing bit write operation to a memory array in integrated circuits |
Uma Srinivasan, Daniel Rodko, Matthew Steven Hyde, William V. Huott |
2023-05-23 |
$8,730,000 |
| 11081202 |
Failing address registers for built-in self tests |
Uma Srinivasan, Gregory J. Fredeman, Matthew Steven Hyde, Thomas E. Miller |
2021-08-03 |
$4,187,000 |
| 11069422 |
Testing multi-port array in integrated circuits |
Matthew Steven Hyde, Uma Srinivasan, Gregory J. Fredeman |
2021-07-20 |
$5,541,000 |
| 9983261 |
Partition-able storage of test results using inactive storage elements |
William V. Huott, Pradip Patel, Daniel Rodko |
2018-05-29 |
$2,015,000 |
| 9355746 |
Built-in testing of unused element on chip |
Luiz C. Alves, William J. Clarke, Christopher R. Conklin, William V. Huott, Kevin W. Kark +1 more |
2016-05-31 |
$4,553,000 |
| 9136019 |
Built-in testing of unused element on chip |
Luiz C. Alves, William J. Clarke, Christopher R. Conklin, William V. Huott, Kevin W. Kark +1 more |
2015-09-15 |
$3,796,000 |
| 7930601 |
AC ABIST diagnostic method, apparatus and program product |
Joseph Eckelman, Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley, Gary W. Maier +1 more |
2011-04-19 |
$4,236,000 |
| 7793173 |
Efficient memory product for test and soft repair of SRAM with redundancy |
Tom Chang, William V. Huott, Donald W. Plass |
2010-09-07 |
$2,081,000 |
| 7529997 |
Method for self-correcting cache using line delete, data logging, and fuse repair correction |
Patrick J. Meaney, William V. Huott, David J. Lund, Bryan L. Mechtly, Pradip Patel |
2009-05-05 |
$6,523,000 |
| 7437626 |
Efficient method of test and soft repair of SRAM with redundancy |
Tom Chang, William V. Huott, Donald W. Plass |
2008-10-14 |
$7,419,000 |
| 7380191 |
ABIST data compression and serialization for memory built-in self test of SRAM with redundancy |
James Dawson, Donald W. Plass, Kenneth J. Reyer |
2008-05-27 |
$8,304,000 |
| 7219275 |
Method and apparatus for providing flexible modular redundancy allocation for memory built in self test of SRAM with redundancy |
Tom Chang, William V. Huott, Donald W. Plass |
2007-05-15 |
$7,209,000 |
| 7210084 |
Integrated system logic and ABIST data compression for an SRAM directory |
Paul A. Bunce, John D. Davis, Donald W. Plass |
2007-04-24 |
$12,783,000 |
| 7170320 |
Fast pulse powered NOR decode apparatus with pulse stretching and redundancy steering |
James Dawson, Donald W. Plass, Kenneth J. Reyer |
2007-01-30 |
$4,520,000 |
| 7076706 |
Method and apparatus for ABIST diagnostics |
Joseph Eckelman |
2006-07-11 |
$5,175,000 |
| 7076710 |
Non-binary address generation for ABIST |
Tom Chang, James Dawson, Douglas J. Malone |
2006-07-11 |
$5,175,000 |
| 7073105 |
ABIST address generation |
James Dawson, John D. Davis, Douglas J. Malone |
2006-07-04 |
|
| 7068554 |
Apparatus and method for implementing multiple memory redundancy with delay tracking clock |
James Dawson, Donald W. Plass, Kenneth J. Reyer |
2006-06-27 |
$5,894,000 |
| 7064990 |
Method and apparatus for implementing multiple column redundancy for memory |
James Dawson, Donald W. Plass, Kenneth J. Reyer |
2006-06-20 |
$5,983,000 |
| 7009895 |
Method for skip over redundancy decode with very low overhead |
Paul A. Bunce, John D. Davis, Donald W. Plass |
2006-03-07 |
$6,870,000 |
| 6584023 |
System for implementing a column redundancy scheme for arrays with controls that span multiple data bits |
Paul A. Bunce, John D. Davis, Donald W. Plass |
2003-06-24 |
$21,997,000 |
