DF

Donato O. Forlenza

IBM: 21 patents #5,175 of 70,183Top 8%
Overall (All Time): #209,537 of 4,157,543Top 6%
21
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9274172 Selective test pattern processor Orazio P. Forlenza, Michael P. Grace, Bryan J. Robbins 2016-03-01
9274173 Selective test pattern processor Orazio P. Forlenza, Michael P. Grace, Bryan J. Robbins 2016-03-01
9244757 Logic-built-in-self-test diagnostic method for root cause identification Orazio P. Forlenza, Bryan J. Robbins 2016-01-26
9244756 Logic-built-in-self-test diagnostic method for root cause identification Orazio P. Forlenza, Bryan J. Robbins 2016-01-26
8086924 Implementing diagnosis of transitional scan chain defects using logic built in self test LBIST test patterns Orazio P. Forlenza, Phong T. Tran 2011-12-27
8065575 Implementing isolation of VLSI scan chain using ABIST test patterns Orazio P. Forlenza, Phong T. Tran 2011-11-22
7934134 Method and apparatus for performing logic built-in self-testing of an integrated circuit Orazio P. Forlenza, Bryan J. Robbins, Phong T. Tran 2011-04-26
7930601 AC ABIST diagnostic method, apparatus and program product Joseph Eckelman, Orazio P. Forlenza, William J. Hurley, Thomas J. Knips, Gary W. Maier +1 more 2011-04-19
7921346 Verification of array built-in self-test (ABIST) design-for-test/design-for-diagnostics (DFT/DFD) Orazio P. Forlenza, Bryan J. Robbins, Phong T. Tran 2011-04-05
7908532 Automated system and processing for expedient diagnosis of broken shift registers latch chains Joseph Eckelman, Orazio P. Forlenza, Robert B. Gass, Phong T. Tran 2011-03-15
7574644 Functional pattern logic diagnostic method Franco Molika, Phillip J. Nigh 2009-08-11
7475308 implementing deterministic based broken scan chain diagnostics Adrian C. Anderson, Todd Burdine, Orazio P. Forlenza, William J. Hurley, Phong T. Tran 2009-01-06
7395469 Method for implementing deterministic based broken scan chain diagnostics Adrian C. Anderson, Todd Burdine, Orazio P. Forlenza, William J. Hurley, Phong T. Tran 2008-07-01
7395470 Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain Todd Burdine, Orazio P. Forlenza, William J. Hurley, Phong T. Tran 2008-07-01
7392449 Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain Todd Burdine, Orazio P. Forlenza, William J. Hurley, Phong T. Tran 2008-06-24
7225374 ABIST-assisted detection of scan chain defects Todd Burdine, Orazio P. Forlenza, William J. Hurley, Steven Michnowski, James Webb 2007-05-29
7117415 Automated BIST test pattern sequence generator software system and method Orazio P. Forlenza, William J. Hurley, Bryan J. Robbins 2006-10-03
7017095 Functional pattern logic diagnostic method Franco Motika, Phillip J. Nigh 2006-03-21
5960114 Process for identifying and capturing text Norman J. Dauerer, Edward E. Kelley, Franco Motika 1999-09-28
5930270 Logic built in self-test diagnostic method Franco Motika, John J. Shushereba, Phillip J. Nigh 1999-07-27
5640402 Fast flush load of LSSD SRL chains Franco Motika, Adrian C. Anderson 1997-06-17